丝印：SC17SEP；Package：TSSOP；SN54SC6T17-SEP Radiation Tolerant, Hex Schmitt-Trigger Buffer with Integrated Translation

1 Features • Vendor item drawing available, VID V62/24619 • Total ionizing dose characterized at 30 krad (Si) – Total ionizing dose radiation lot acceptance testing (TID RLAT) for every wafer lot to 30 krad (Si) • Single-event effects (SEE) characterized: – Single event latch-up (SEL) immun

文件：1.04015 Mbytes 页数：25 Pages

TI

德州仪器

丝印：SC17SEP；Package：TSSOP；SN54SC6T17-SEP Radiation Tolerant, Hex Schmitt-Trigger Buffer with Integrated Translation

1 Features • Vendor item drawing available, VID V62/24619 • Total ionizing dose characterized at 30 krad (Si) – Total ionizing dose radiation lot acceptance testing (TID RLAT) for every wafer lot to 30 krad (Si) • Single-event effects (SEE) characterized: – Single event latch-up (SEL) immun

文件：1.03653 Mbytes 页数：24 Pages

TI

德州仪器

丝印：SC17SEP；Package：TSSOP；SN54SC6T17-SEP Radiation Tolerant, Hex Schmitt-Trigger Buffer with Integrated Translation

1 Features • Vendor item drawing available, VID V62/24619 • Total ionizing dose characterized at 30 krad (Si) – Total ionizing dose radiation lot acceptance testing (TID RLAT) for every wafer lot to 30 krad (Si) • Single-event effects (SEE) characterized: – Single event latch-up (SEL) immun

文件：1.04015 Mbytes 页数：25 Pages

TI

德州仪器

丝印：SC17SEP；Package：TSSOP；SN54SC6T17-SEP Radiation Tolerant, Hex Schmitt-Trigger Buffer with Integrated Translation

1 Features • Vendor item drawing available, VID V62/24619 • Total ionizing dose characterized at 30 krad (Si) – Total ionizing dose radiation lot acceptance testing (TID RLAT) for every wafer lot to 30 krad (Si) • Single-event effects (SEE) characterized: – Single event latch-up (SEL) immun

文件：1.04015 Mbytes 页数：25 Pages

TI

德州仪器