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SN54SC2T74MPWTSEP	文件：1.06467 Mbytes Page：28 Pages	Marking：SC74SEP；Package：TSSOP；SN54SC2T74-SEP Radiation Tolerant, Dual D-Type Flip-Flop With Integrated Translation 1Features •Vendoritemdrawingavailable,VID V62/23632-01XE •Totalionizingdosecharacterizedat30krad(Si) –Totalionizingdoseradiationlotacceptance testing(TIDRLAT)foreverywaferlotto30 krad(Si) •Single-eventeffects(SEE)characterized: –Singleeventlatch-up(SEL)	TI1Texas Instruments 德州仪器美国德州仪器公司	TI1
SN54SC2T74MPWTSEP	文件：1.06507 Mbytes Page：28 Pages	Marking：SC74SEP；Package：TSSOP；SN54SC2T74-SEP Radiation Tolerant, Dual D-Type Flip-Flop With Integrated Translation 1Features •Vendoritemdrawingavailable,VID V62/23632-01XE •Totalionizingdosecharacterizedat30krad(Si) –Totalionizingdoseradiationlotacceptance testing(TIDRLAT)foreverywaferlotto30 krad(Si) •Single-eventeffects(SEE)characterized: –Singleeventlatch-up(SEL)	TI1Texas Instruments 德州仪器美国德州仪器公司	TI1
SN54SC2T74MPWTSEP	文件：1.06507 Mbytes Page：28 Pages	Marking：SC74SEP；Package：TSSOP；SN54SC2T74-SEP Radiation Tolerant, Dual D-Type Flip-Flop With Integrated Translation 1Features •Vendoritemdrawingavailable,VID V62/23632-01XE •Totalionizingdosecharacterizedat30krad(Si) –Totalionizingdoseradiationlotacceptance testing(TIDRLAT)foreverywaferlotto30 krad(Si) •Single-eventeffects(SEE)characterized: –Singleeventlatch-up(SEL)	TI1Texas Instruments 德州仪器美国德州仪器公司	TI1
SN54SC2T74MPWTSEP	文件：1.15731 Mbytes Page：30 Pages	Marking：SC74SEP；Package：TSSOP；SN54SC2T74-SEP Radiation Tolerant, Dual D-Type Flip-Flop With Integrated Translation 1Features •Vendoritemdrawingavailable,VID V62/23632-01XE •Totalionizingdosecharacterizedat30krad(Si) –Totalionizingdoseradiationlotacceptance testing(TIDRLAT)foreverywaferlotto30 krad(Si) •Single-eventeffects(SEE)characterized: –Singleeventlatch-up(SEL)	TITexas Instruments 德州仪器美国德州仪器公司	TI
V62/23632-01XE	文件：1.15731 Mbytes Page：30 Pages	Marking：SC74SEP；Package：TSSOP；SN54SC2T74-SEP Radiation Tolerant, Dual D-Type Flip-Flop With Integrated Translation 1Features •Vendoritemdrawingavailable,VID V62/23632-01XE •Totalionizingdosecharacterizedat30krad(Si) –Totalionizingdoseradiationlotacceptance testing(TIDRLAT)foreverywaferlotto30 krad(Si) •Single-eventeffects(SEE)characterized: –Singleeventlatch-up(SEL)	TITexas Instruments 德州仪器美国德州仪器公司	TI
V62/23632-01XE	文件：1.06467 Mbytes Page：28 Pages	Marking：SC74SEP；Package：TSSOP；SN54SC2T74-SEP Radiation Tolerant, Dual D-Type Flip-Flop With Integrated Translation 1Features •Vendoritemdrawingavailable,VID V62/23632-01XE •Totalionizingdosecharacterizedat30krad(Si) –Totalionizingdoseradiationlotacceptance testing(TIDRLAT)foreverywaferlotto30 krad(Si) •Single-eventeffects(SEE)characterized: –Singleeventlatch-up(SEL)	TI1Texas Instruments 德州仪器美国德州仪器公司	TI1
V62/23632-01XE	文件：1.06507 Mbytes Page：28 Pages	Marking：SC74SEP；Package：TSSOP；SN54SC2T74-SEP Radiation Tolerant, Dual D-Type Flip-Flop With Integrated Translation 1Features •Vendoritemdrawingavailable,VID V62/23632-01XE •Totalionizingdosecharacterizedat30krad(Si) –Totalionizingdoseradiationlotacceptance testing(TIDRLAT)foreverywaferlotto30 krad(Si) •Single-eventeffects(SEE)characterized: –Singleeventlatch-up(SEL)	TI1Texas Instruments 德州仪器美国德州仪器公司	TI1
V62/23632-01XE	文件：1.06507 Mbytes Page：28 Pages	Marking：SC74SEP；Package：TSSOP；SN54SC2T74-SEP Radiation Tolerant, Dual D-Type Flip-Flop With Integrated Translation 1Features •Vendoritemdrawingavailable,VID V62/23632-01XE •Totalionizingdosecharacterizedat30krad(Si) –Totalionizingdoseradiationlotacceptance testing(TIDRLAT)foreverywaferlotto30 krad(Si) •Single-eventeffects(SEE)characterized: –Singleeventlatch-up(SEL)	TI1Texas Instruments 德州仪器美国德州仪器公司	TI1
V62SLASH23632-01XE	文件：1.06467 Mbytes Page：28 Pages	Marking：SC74SEP；Package：TSSOP；SN54SC2T74-SEP Radiation Tolerant, Dual D-Type Flip-Flop With Integrated Translation 1Features •Vendoritemdrawingavailable,VID V62/23632-01XE •Totalionizingdosecharacterizedat30krad(Si) –Totalionizingdoseradiationlotacceptance testing(TIDRLAT)foreverywaferlotto30 krad(Si) •Single-eventeffects(SEE)characterized: –Singleeventlatch-up(SEL)	TI1Texas Instruments 德州仪器美国德州仪器公司	TI1
V62SLASH23632-01XE	文件：1.06507 Mbytes Page：28 Pages	Marking：SC74SEP；Package：TSSOP；SN54SC2T74-SEP Radiation Tolerant, Dual D-Type Flip-Flop With Integrated Translation 1Features •Vendoritemdrawingavailable,VID V62/23632-01XE •Totalionizingdosecharacterizedat30krad(Si) –Totalionizingdoseradiationlotacceptance testing(TIDRLAT)foreverywaferlotto30 krad(Si) •Single-eventeffects(SEE)characterized: –Singleeventlatch-up(SEL)	TI1Texas Instruments 德州仪器美国德州仪器公司	TI1

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