丝印：ABT8245；Package：SOIC；SCAN TEST DEVICES WITH OCTAL BUS TRANSCEIVERS

Members of the Texas Instruments SCOPE E Family of Testability Products Compatible With the IEEE Standard 1149.1-1990 (JTAG) Test Access Port and Boundary-Scan Architecture Functionally Equivalent to ’F245 and ’ABT245 in the Normal-Function Mode SCOPE E Instruction Set: – IEEE Standard 114

文件：594.41 Kbytes 页数：32 Pages

TI

德州仪器

丝印：ABT8245；Package：SOIC；SCAN TEST DEVICES WITH OCTAL BUS TRANSCEIVERS

Members of the Texas Instruments SCOPE E Family of Testability Products Compatible With the IEEE Standard 1149.1-1990 (JTAG) Test Access Port and Boundary-Scan Architecture Functionally Equivalent to ’F245 and ’ABT245 in the Normal-Function Mode SCOPE E Instruction Set: – IEEE Standard 114

文件：594.41 Kbytes 页数：32 Pages

TI

德州仪器

丝印：ABT8245；Package：SOIC；SCAN TEST DEVICES WITH OCTAL BUS TRANSCEIVERS

Members of the Texas Instruments SCOPE E Family of Testability Products Compatible With the IEEE Standard 1149.1-1990 (JTAG) Test Access Port and Boundary-Scan Architecture Functionally Equivalent to ’F245 and ’ABT245 in the Normal-Function Mode SCOPE E Instruction Set: – IEEE Standard 114

文件：594.41 Kbytes 页数：32 Pages

TI

德州仪器

丝印：ABT8245；Package：SOIC；SCAN TEST DEVICES WITH OCTAL BUS TRANSCEIVERS

Members of the Texas Instruments SCOPE E Family of Testability Products Compatible With the IEEE Standard 1149.1-1990 (JTAG) Test Access Port and Boundary-Scan Architecture Functionally Equivalent to ’F245 and ’ABT245 in the Normal-Function Mode SCOPE E Instruction Set: – IEEE Standard 114

文件：594.41 Kbytes 页数：32 Pages

TI

德州仪器

丝印：ABT8245；Package：SOIC；SCAN TEST DEVICES WITH OCTAL BUS TRANSCEIVERS

Members of the Texas Instruments SCOPE E Family of Testability Products Compatible With the IEEE Standard 1149.1-1990 (JTAG) Test Access Port and Boundary-Scan Architecture Functionally Equivalent to ’F245 and ’ABT245 in the Normal-Function Mode SCOPE E Instruction Set: – IEEE Standard 114

文件：594.41 Kbytes 页数：32 Pages

TI

德州仪器