SN74ABT8646DW.B芯片丝印丝印对应型号-114ic电子网

型号	下载订购	功能描述	制造商上传企业	LOGO
SN74ABT8646DW	文件：625.48 Kbytes Page：34 Pages	丝印：ABT8646；Package：SOIC；SCAN TEST DEVICES WITH OCTAL BUS TRANSCEIVERS AND REGISTERS Members of the Texas Instruments SCOPE Family of Testability Products Compatible With the IEEE Standard 1149.1-1990 (JTAG) Test Access Port and Boundary-Scan Architecture Functionally Equivalent to ’F646 and ’ABT646 in the Normal-Function Mode SCOPE Instruction Set − IEEE Standard 1149.1 文件：625.48 Kbytes 页数：34 Pages	TI 德州仪器	TI
SN74ABT8646DW.B	文件：625.48 Kbytes Page：34 Pages	丝印：ABT8646；Package：SOIC；SCAN TEST DEVICES WITH OCTAL BUS TRANSCEIVERS AND REGISTERS Members of the Texas Instruments SCOPE Family of Testability Products Compatible With the IEEE Standard 1149.1-1990 (JTAG) Test Access Port and Boundary-Scan Architecture Functionally Equivalent to ’F646 and ’ABT646 in the Normal-Function Mode SCOPE Instruction Set − IEEE Standard 1149.1 文件：625.48 Kbytes 页数：34 Pages	TI 德州仪器	TI

更多ABT8646供应商更新时间2025-9-19 15:15:00