丝印：ABTH182502A；Package：LQFP；SCAN TEST DEVICES WITH 18-BIT UNIVERSAL BUS TRANSCEIVERS

Members of the Texas Instruments SCOPE E Family of Testability Products Members of the Texas Instruments Widebus E Family Compatible With the IEEE Standard 1149.1-1990 (JTAG) Test Access Port and Boundary-Scan Architecture UBT E (Universal Bus Transceiver) Combines D-Type Latches and D-Typ

文件：926.08 Kbytes 页数：47 Pages

TI

德州仪器

丝印：ABTH182502A；Package：LQFP；SCAN TEST DEVICES WITH 18-BIT UNIVERSAL BUS TRANSCEIVERS

Members of the Texas Instruments SCOPE E Family of Testability Products Members of the Texas Instruments Widebus E Family Compatible With the IEEE Standard 1149.1-1990 (JTAG) Test Access Port and Boundary-Scan Architecture UBT E (Universal Bus Transceiver) Combines D-Type Latches and D-Typ

文件：926.08 Kbytes 页数：47 Pages

TI

德州仪器

丝印：ABTH182502A；Package：LQFP；SCAN TEST DEVICES WITH 18-BIT UNIVERSAL BUS TRANSCEIVERS

Members of the Texas Instruments SCOPE E Family of Testability Products Members of the Texas Instruments Widebus E Family Compatible With the IEEE Standard 1149.1-1990 (JTAG) Test Access Port and Boundary-Scan Architecture UBT E (Universal Bus Transceiver) Combines D-Type Latches and D-Typ

文件：924.4 Kbytes 页数：47 Pages

TI

德州仪器

丝印：ABTH182502A；Package：LQFP；SCAN TEST DEVICES WITH 18-BIT UNIVERSAL BUS TRANSCEIVERS

Members of the Texas Instruments SCOPE E Family of Testability Products Members of the Texas Instruments Widebus E Family Compatible With the IEEE Standard 1149.1-1990 (JTAG) Test Access Port and Boundary-Scan Architecture UBT E (Universal Bus Transceiver) Combines D-Type Latches and D-Typ

文件：926.08 Kbytes 页数：47 Pages

TI

德州仪器