丝印：ABTH182652A；Package：LQFP；SCAN TEST DEVICES WITH 18-BIT BUS TRANSCEIVERS AND REGISTERS

Members of the Texas Instruments SCOPE  Family of Testability Products Members of the Texas Instruments Widebus Family Compatible With the IEEE Standard 1149.1-1990 (JTAG) Test Access Port and Boundary-Scan Architecture Include D-Type Flip-Flops and Control Circuitry to Provide Multiplex

文件：830.88 Kbytes 页数：42 Pages

TI

德州仪器

丝印：ABTH182652A；Package：LQFP；SCAN TEST DEVICES WITH 18-BIT BUS TRANSCEIVERS AND REGISTERS

Members of the Texas Instruments SCOPE  Family of Testability Products Members of the Texas Instruments Widebus Family Compatible With the IEEE Standard 1149.1-1990 (JTAG) Test Access Port and Boundary-Scan Architecture Include D-Type Flip-Flops and Control Circuitry to Provide Multiplex

文件：830.88 Kbytes 页数：42 Pages

TI

德州仪器

丝印：ABTH182652A；Package：LQFP；SCAN TEST DEVICES WITH 18-BIT BUS TRANSCEIVERS AND REGISTERS

Members of the Texas Instruments SCOPE ™ Family of Testability Products Members of the Texas Instruments. Widebus™ Family Compatible With the IEEE Standard 1149.1-1990 (JTAG) Test Access Port and Boundary-Scan Architecture Include D-Type Flip-Flops and Control Circuitry to Provide Mult

文件：858.09 Kbytes 页数：41 Pages

TI

德州仪器

丝印：ABTH182652A；Package：LQFP；SCAN TEST DEVICES WITH 18-BIT BUS TRANSCEIVERS AND REGISTERS

Members of the Texas Instruments SCOPE  Family of Testability Products Members of the Texas Instruments Widebus Family Compatible With the IEEE Standard 1149.1-1990 (JTAG) Test Access Port and Boundary-Scan Architecture Include D-Type Flip-Flops and Control Circuitry to Provide Multiplex

文件：830.88 Kbytes 页数：42 Pages

TI

德州仪器