丝印：ABTH18504A；Package：LQFP；SCAN TEST DEVICES WITH 20-BIT UNIVERSAL BUS TRANSCEIVERS

Members of the Texas Instruments SCOPEE Family of Testability Products Members of the Texas Instruments WidebusE Family Compatible With the IEEE Standard 1149.1-1990 (JTAG) Test Access Port and Boundary-Scan Architecture UBT E (Universal Bus Transceiver) Combines D-Type Latches and D-Type

文件：815.37 Kbytes 页数：41 Pages

TI

德州仪器

丝印：ABTH18504A；Package：LQFP；SCAN TEST DEVICES WITH 20-BIT UNIVERSAL BUS TRANSCEIVERS

Members of the Texas Instruments SCOPEE Family of Testability Products Members of the Texas Instruments WidebusE Family Compatible With the IEEE Standard 1149.1-1990 (JTAG) Test Access Port and Boundary-Scan Architecture UBT E (Universal Bus Transceiver) Combines D-Type Latches and D-Type

文件：815.37 Kbytes 页数：41 Pages

TI

德州仪器

丝印：ABTH18504A；Package：LQFP；SCAN TEST DEVICES WITH 20-BIT UNIVERSAL BUS TRANSCEIVERS

Members of the Texas Instruments SCOPEE Family of Testability Products Members of the Texas Instruments WidebusE Family Compatible With the IEEE Standard 1149.1-1990 (JTAG) Test Access Port and Boundary-Scan Architecture UBT E (Universal Bus Transceiver) Combines D-Type Latches and D-Type

文件：815.37 Kbytes 页数：41 Pages

TI

德州仪器