丝印：ABT8652；Package：SSOP；SCAN TEST DEVICES WITH OCTAL BUS TRANSCEIVERS AND REGISTERS

Members of the Texas Instruments SCOPE E Family of Testability Products Compatible With the IEEE Standard 1149.1-1990 (JTAG) Test Access Port and Boundary-Scan Architecture Functionally Equivalent to ’F652 and ABT652 in the Normal-Function Mode SCOPE E Instruction Set – IEEE Standard 1149.

文件：589.09 Kbytes 页数：32 Pages

TI

德州仪器

丝印：ABT8652；Package：SSOP；SCAN TEST DEVICES WITH OCTAL BUS TRANSCEIVERS AND REGISTERS

Members of the Texas Instruments SCOPE E Family of Testability Products Compatible With the IEEE Standard 1149.1-1990 (JTAG) Test Access Port and Boundary-Scan Architecture Functionally Equivalent to ’F652 and ABT652 in the Normal-Function Mode SCOPE E Instruction Set – IEEE Standard 1149.

文件：589.09 Kbytes 页数：32 Pages

TI

德州仪器

丝印：ABT8652；Package：SOIC；SCAN TEST DEVICES WITH OCTAL BUS TRANSCEIVERS AND REGISTERS

Members of the Texas Instruments SCOPE E Family of Testability Products Compatible With the IEEE Standard 1149.1-1990 (JTAG) Test Access Port and Boundary-Scan Architecture Functionally Equivalent to ’F652 and ABT652 in the Normal-Function Mode SCOPE E Instruction Set – IEEE Standard 1149.

文件：589.09 Kbytes 页数：32 Pages

TI

德州仪器

丝印：ABT8652；Package：SOIC；SCAN TEST DEVICES WITH OCTAL BUS TRANSCEIVERS AND REGISTERS

Members of the Texas Instruments SCOPE E Family of Testability Products Compatible With the IEEE Standard 1149.1-1990 (JTAG) Test Access Port and Boundary-Scan Architecture Functionally Equivalent to ’F652 and ABT652 in the Normal-Function Mode SCOPE E Instruction Set – IEEE Standard 1149.

文件：589.09 Kbytes 页数：32 Pages

TI

德州仪器