SN74ABT8652DW.B中文资料德州仪器数据手册PDF规格书

Members of the Texas Instruments

SCOPE E Family of Testability Products

Compatible With the IEEE Standard

1149.1-1990 (JTAG) Test Access Port and

Boundary-Scan Architecture

Functionally Equivalent to ’F652 and

ABT652 in the Normal-Function Mode

SCOPE E Instruction Set

– IEEE Standard 1149.1-1990 Required

Instructions, Optional INTEST, CLAMP,

and HIGHZ

– Parallel-Signature Analysis at Inputs

With Masking Option

– Pseudo-Random Pattern Generation

From Outputs

– Sample Inputs/Toggle Outputs

– Binary Count From Outputs

– Even-Parity Opcodes

Two Boundary-Scan Cells Per I/O for

Greater Flexibility

State-of-the-Art EPIC-IIB E BiCMOS Design

Significantly Reduces Power Dissipation

Package Options Include Shrink

Small-Outline (DL) and Plastic

Small-Outline (DW) Packages, Ceramic

Chip Carriers (FK), and Standard Ceramic

DIPs (JT)

description

The ’ABT8652 scan test devices with octal bus

transceivers and registers are members of the

Texas Instruments SCOPEE testability

integrated-circuit family. This family of devices

supports IEEE Standard 1149.1-1990 boundary

scan to facilitate testing of complex circuit-board

assemblies. Scan access to the test circuitry is

accomplished via the 4-wire test access port

(TAP) interface.

In the normal mode, these devices are functionally equivalent to the ’F652 and ’ABT652 octal bus transceivers

and registers. The test circuitry can be activated by the TAP to take snapshot samples of the data appearing

at the device pins or to perform a self test on the boundary-test cells. Activating the TAP in normal mode does

not affect the functional operation of the SCOPEE octal bus transceivers and registers.