首页 >SN74ABT8245DW>规格书列表
| 型号 | 下载 订购 | 功能描述 | 制造商 上传企业 | LOGO |
|---|---|---|---|---|
SN74ABT8245DW | 丝印：ABT8245；Package：SOIC；SCAN TEST DEVICES WITH OCTAL BUS TRANSCEIVERS Members of the Texas Instruments SCOPE E Family of Testability Products Compatible With the IEEE Standard 1149.1-1990 (JTAG) Test Access Port and Boundary-Scan Architecture Functionally Equivalent to ’F245 and ’ABT245 in the Normal-Function Mode SCOPE E Instruction Set: – IEEE Standard 114 文件：594.41 Kbytes 页数：32 Pages | TI 德州仪器 | TI | |
SN74ABT8245DW | SCAN TEST DEVICES WITH OCTAL BUS TRANSCEIVERS 文件：483.36 Kbytes 页数：28 Pages | TI 德州仪器 | TI | |
SN74ABT8245DW | SCAN TEST DEVICES WITH OCTAL BUS TRANSCEIVERS 文件：635.5 Kbytes 页数：30 Pages | TI 德州仪器 | TI | |
SN74ABT8245DW | SCAN TEST DEVICES WITH OCTAL BUS TRANSCEIVERS 文件：364.54 Kbytes 页数：25 Pages | TI 德州仪器 | TI | |
丝印：ABT8245；Package：SOIC；SCAN TEST DEVICES WITH OCTAL BUS TRANSCEIVERS Members of the Texas Instruments SCOPE E Family of Testability Products Compatible With the IEEE Standard 1149.1-1990 (JTAG) Test Access Port and Boundary-Scan Architecture Functionally Equivalent to ’F245 and ’ABT245 in the Normal-Function Mode SCOPE E Instruction Set: – IEEE Standard 114 文件：594.41 Kbytes 页数：32 Pages | TI 德州仪器 | TI | ||
丝印：ABT8245；Package：SOIC；SCAN TEST DEVICES WITH OCTAL BUS TRANSCEIVERS Members of the Texas Instruments SCOPE E Family of Testability Products Compatible With the IEEE Standard 1149.1-1990 (JTAG) Test Access Port and Boundary-Scan Architecture Functionally Equivalent to ’F245 and ’ABT245 in the Normal-Function Mode SCOPE E Instruction Set: – IEEE Standard 114 文件：594.41 Kbytes 页数：32 Pages | TI 德州仪器 | TI | ||
丝印：ABT8245；Package：SOIC；SCAN TEST DEVICES WITH OCTAL BUS TRANSCEIVERS Members of the Texas Instruments SCOPE E Family of Testability Products Compatible With the IEEE Standard 1149.1-1990 (JTAG) Test Access Port and Boundary-Scan Architecture Functionally Equivalent to ’F245 and ’ABT245 in the Normal-Function Mode SCOPE E Instruction Set: – IEEE Standard 114 文件：594.41 Kbytes 页数：32 Pages | TI 德州仪器 | TI | ||
丝印：ABT8245；Package：SOIC；SCAN TEST DEVICES WITH OCTAL BUS TRANSCEIVERS Members of the Texas Instruments SCOPE E Family of Testability Products Compatible With the IEEE Standard 1149.1-1990 (JTAG) Test Access Port and Boundary-Scan Architecture Functionally Equivalent to ’F245 and ’ABT245 in the Normal-Function Mode SCOPE E Instruction Set: – IEEE Standard 114 文件：594.41 Kbytes 页数：32 Pages | TI 德州仪器 | TI | ||
SCAN TEST DEVICES WITH OCTAL BUS TRANSCEIVERS 文件：483.36 Kbytes 页数：28 Pages | TI 德州仪器 | TI | ||
SCAN TEST DEVICES WITH OCTAL BUS TRANSCEIVERS 文件：635.5 Kbytes 页数：30 Pages | TI 德州仪器 | TI |
产品属性
- 产品编号：
SN74ABT8245DW
- 制造商：
Texas Instruments
- 类别：
集成电路（IC） > 专用逻辑器件
- 系列：
74ABT
- 包装：
卷带（TR）剪切带（CT）Digi-Reel® 得捷定制卷带
- 逻辑类型：
扫描测试设备，带总线收发器
- 供电电压：
4.5V ~ 5.5V
- 位数：
8
- 工作温度：
-40°C ~ 85°C
- 安装类型：
表面贴装型
- 封装/外壳：
24-SOIC（0.295"，7.50mm 宽）
- 供应商器件封装：
24-SOIC
- 描述：
IC SCAN TEST DEV/TXRX 24-SOIC
| 供应商 | 型号 | 品牌 | 批号 | 封装 | 库存 | 备注 | 价格 |
|---|---|---|---|---|---|---|---|
24+ |
3000 |
自己现货 |
询价 | ||||
TEXASINSTRU |
24+ |
原封装 |
3815 |
原装现货假一罚十 |
询价 | ||
TI |
1716+ |
? |
14860 |
只做原装进口,假一罚十 |
询价 | ||
TexasInstruments |
18+ |
ICSCANTESTDEV/TXRX24-SOI |
6800 |
公司原装现货/欢迎来电咨询! |
询价 | ||
Texas Instruments |
24+ |
24-SOIC |
56200 |
一级代理/放心采购 |
询价 | ||
TI |
25+ |
SOP-24 |
932 |
就找我吧!--邀您体验愉快问购元件! |
询价 | ||
TI(德州仪器) |
2021+ |
SOIC-24 |
499 |
询价 | |||
TI |
23+ |
N/A |
7560 |
原厂原装 |
询价 | ||
TEXAS INSTRUMENTS |
23+ |
SOIC24 |
9600 |
全新原装正品!一手货源价格优势! |
询价 | ||
TI |
22+ |
24SOIC |
9000 |
原厂渠道,现货配单 |
询价 |
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