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SN74ABT8245DWG4集成电路(IC)的专用逻辑器件规格书PDF中文资料

| 厂商型号 |
SN74ABT8245DWG4 |
| 参数属性 | SN74ABT8245DWG4 封装/外壳为24-SOIC(0.295",7.50mm 宽);包装为管件;类别为集成电路(IC)的专用逻辑器件;产品描述:IC SCAN TEST DEVICE 24SOIC |
| 功能描述 | SCAN TEST DEVICES WITH OCTAL BUS TRANSCEIVERS |
| 丝印标识 | |
| 封装外壳 | SOIC / 24-SOIC(0.295",7.50mm 宽) |
| 文件大小 |
594.41 Kbytes |
| 页面数量 |
32 页 |
| 生产厂商 | TI |
| 中文名称 | 德州仪器 |
| 网址 | |
| 数据手册 | |
| 更新时间 | 2025-11-12 16:20:00 |
| 人工找货 | SN74ABT8245DWG4价格和库存,欢迎联系客服免费人工找货 |
SN74ABT8245DWG4规格书详情
SN74ABT8245DWG4属于集成电路(IC)的专用逻辑器件。由德州仪器制造生产的SN74ABT8245DWG4专用逻辑器件专用逻辑 IC 设计提供应用特定的逻辑输出类型,例如 BCD 速率倍增、可寻址扫描端口、总线终端阵列、CML 驱动器、比较器、ABT 扫描测试、二进制全加法器、互补对加逆变器、可配置缓冲器、触点颤动消除器、晶体振荡器、延迟元件、差分接收器、LVTTL 到 GTLP 收发器、存储器解码器、电源良好检测器和分频器。
Members of the Texas Instruments
SCOPE E Family of Testability Products
Compatible With the IEEE Standard
1149.1-1990 (JTAG) Test Access Port
and Boundary-Scan Architecture
Functionally Equivalent to ’F245 and
’ABT245 in the Normal-Function Mode
SCOPE E Instruction Set:
– IEEE Standard 1149.1-1990 Required
Instructions, Optional INTEST, CLAMP,
and HIGHZ
– Parallel-Signature Analysis at Inputs
With Masking Option
– Pseudo-Random Pattern Generation
From Outputs
– Sample Inputs/Toggle Outputs
– Binary Count From Outputs
– Even-Parity Opcodes
Two Boundary-Scan Cells per I/O for
Greater Flexibility
State-of-the-Art EPIC-IIBE BiCMOS Design
Significantly Reduces Power Dissipation
Package Options Include Plastic
Small-Outline Packages (DW), Ceramic
Chip Carriers(FK), and Standard Ceramic
DIPs (JT)
description
The ’ABT8245 scan test devices with octal bus
transceivers are members of the Texas Instruments
SCOPEE testability integrated-circuit
family. This family of devices supports IEEE
Standard 1149.1-1990 boundary scan to facilitate
testing of complex circuit-board assemblies. Scan
access to the test circuitry is accomplished via the
4-wire test access port (TAP) interface.
In the normal mode, these devices are functionally equivalent to the ’F245 and ’ABT245 octal bus transceivers.
The test circuitry can be activated by the TAP to take snapshot samples of the data appearing at the device pins
or to perform a self test on the boundary-test cells. Activating the TAP in normal mode does not affect the
functional operation of the SCOPEE octal bus transceivers.
Data flow is controlled by the direction-control (DIR) and output-enable (OE) inputs. Data transmission is
allowed from the A bus to the B bus or from the B bus to the A bus, depending on the logic level at DIR. The
output-enable (OE) input can be used to disable the device so that the buses are effectively isolated.
产品属性
更多- 产品编号:
SN74ABT8245DWG4
- 制造商:
Texas Instruments
- 类别:
集成电路(IC) > 专用逻辑器件
- 系列:
74ABT
- 包装:
管件
- 逻辑类型:
扫描测试设备,带总线收发器
- 供电电压:
4.5V ~ 5.5V
- 位数:
8
- 工作温度:
-40°C ~ 85°C
- 安装类型:
表面贴装型
- 封装/外壳:
24-SOIC(0.295",7.50mm 宽)
- 供应商器件封装:
24-SOIC
- 描述:
IC SCAN TEST DEVICE 24SOIC
| 供应商 | 型号 | 品牌 | 批号 | 封装 | 库存 | 备注 | 价格 |
|---|---|---|---|---|---|---|---|
TI |
25+ |
70 |
公司优势库存 热卖中! |
询价 | |||
TI |
25+ |
标准封装 |
18000 |
原厂直接发货进口原装 |
询价 | ||
TEXAS |
17+ |
NA |
6200 |
100%原装正品现货 |
询价 | ||
TI |
23+ |
SOP24 |
5000 |
原装正品,假一罚十 |
询价 | ||
TEXAS |
20+ |
SOP |
2960 |
诚信交易大量库存现货 |
询价 | ||
TI |
24+ |
SOIC24 |
2004 |
询价 | |||
Texas Instruments |
24+ |
24-SOIC |
56200 |
一级代理/放心采购 |
询价 | ||
TexasInstruments |
18+ |
ICSCANTESTDEVICE24SOIC |
6800 |
公司原装现货/欢迎来电咨询! |
询价 | ||
TI/德州仪器 |
25+ |
原厂封装 |
10280 |
原厂授权代理,专注军工、汽车、医疗、工业、新能源! |
询价 | ||
TI(德州仪器) |
24+ |
SOP24300mil |
1493 |
原装现货,免费供样,技术支持,原厂对接 |
询价 |

