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SN74ABT8245DWG4集成电路(IC)的专用逻辑器件规格书PDF中文资料

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厂商型号

SN74ABT8245DWG4

参数属性

SN74ABT8245DWG4 封装/外壳为24-SOIC(0.295",7.50mm 宽);包装为管件;类别为集成电路(IC)的专用逻辑器件;产品描述:IC SCAN TEST DEVICE 24SOIC

功能描述

SCAN TEST DEVICES WITH OCTAL BUS TRANSCEIVERS
IC SCAN TEST DEVICE 24SOIC

丝印标识

ABT8245

封装外壳

SOIC / 24-SOIC(0.295",7.50mm 宽)

文件大小

594.41 Kbytes

页面数量

32

生产厂商

TI

中文名称

德州仪器

网址

网址

数据手册

原厂下载下载地址一下载地址二到原厂下载

更新时间

2025-11-12 16:20:00

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SN74ABT8245DWG4价格和库存,欢迎联系客服免费人工找货

SN74ABT8245DWG4规格书详情

SN74ABT8245DWG4属于集成电路(IC)的专用逻辑器件。由德州仪器制造生产的SN74ABT8245DWG4专用逻辑器件专用逻辑 IC 设计提供应用特定的逻辑输出类型,例如 BCD 速率倍增、可寻址扫描端口、总线终端阵列、CML 驱动器、比较器、ABT 扫描测试、二进制全加法器、互补对加逆变器、可配置缓冲器、触点颤动消除器、晶体振荡器、延迟元件、差分接收器、LVTTL 到 GTLP 收发器、存储器解码器、电源良好检测器和分频器。

Members of the Texas Instruments

SCOPE E Family of Testability Products

Compatible With the IEEE Standard

1149.1-1990 (JTAG) Test Access Port

and Boundary-Scan Architecture

Functionally Equivalent to ’F245 and

’ABT245 in the Normal-Function Mode

SCOPE E Instruction Set:

– IEEE Standard 1149.1-1990 Required

Instructions, Optional INTEST, CLAMP,

and HIGHZ

– Parallel-Signature Analysis at Inputs

With Masking Option

– Pseudo-Random Pattern Generation

From Outputs

– Sample Inputs/Toggle Outputs

– Binary Count From Outputs

– Even-Parity Opcodes

Two Boundary-Scan Cells per I/O for

Greater Flexibility

State-of-the-Art EPIC-IIBE BiCMOS Design

Significantly Reduces Power Dissipation

Package Options Include Plastic

Small-Outline Packages (DW), Ceramic

Chip Carriers(FK), and Standard Ceramic

DIPs (JT)

description

The ’ABT8245 scan test devices with octal bus

transceivers are members of the Texas Instruments

SCOPEE testability integrated-circuit

family. This family of devices supports IEEE

Standard 1149.1-1990 boundary scan to facilitate

testing of complex circuit-board assemblies. Scan

access to the test circuitry is accomplished via the

4-wire test access port (TAP) interface.

In the normal mode, these devices are functionally equivalent to the ’F245 and ’ABT245 octal bus transceivers.

The test circuitry can be activated by the TAP to take snapshot samples of the data appearing at the device pins

or to perform a self test on the boundary-test cells. Activating the TAP in normal mode does not affect the

functional operation of the SCOPEE octal bus transceivers.

Data flow is controlled by the direction-control (DIR) and output-enable (OE) inputs. Data transmission is

allowed from the A bus to the B bus or from the B bus to the A bus, depending on the logic level at DIR. The

output-enable (OE) input can be used to disable the device so that the buses are effectively isolated.

产品属性

更多
  • 产品编号:

    SN74ABT8245DWG4

  • 制造商:

    Texas Instruments

  • 类别:

    集成电路(IC) > 专用逻辑器件

  • 系列:

    74ABT

  • 包装:

    管件

  • 逻辑类型:

    扫描测试设备,带总线收发器

  • 供电电压:

    4.5V ~ 5.5V

  • 位数:

    8

  • 工作温度:

    -40°C ~ 85°C

  • 安装类型:

    表面贴装型

  • 封装/外壳:

    24-SOIC(0.295",7.50mm 宽)

  • 供应商器件封装:

    24-SOIC

  • 描述:

    IC SCAN TEST DEVICE 24SOIC

供应商 型号 品牌 批号 封装 库存 备注 价格
TI
25+
70
公司优势库存 热卖中!
询价
TI
25+
标准封装
18000
原厂直接发货进口原装
询价
TEXAS
17+
NA
6200
100%原装正品现货
询价
TI
23+
SOP24
5000
原装正品,假一罚十
询价
TEXAS
20+
SOP
2960
诚信交易大量库存现货
询价
TI
24+
SOIC24
2004
询价
Texas Instruments
24+
24-SOIC
56200
一级代理/放心采购
询价
TexasInstruments
18+
ICSCANTESTDEVICE24SOIC
6800
公司原装现货/欢迎来电咨询!
询价
TI/德州仪器
25+
原厂封装
10280
原厂授权代理,专注军工、汽车、医疗、工业、新能源!
询价
TI(德州仪器)
24+
SOP24300mil
1493
原装现货,免费供样,技术支持,原厂对接
询价