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V62/23627-01XE

Marking:SC00SEP;Package:TSSOP;SN54SC4T00-SEP Radiation Tolerant, Quadruple 2-Input Positive-NAND Gates With Integrated Translation

1Features •Vendoritemdrawingavailable,VID V62/23627-01XE •Totalionizingdosecharacterizedat30krad(Si) –Totalionizingdoseradiationlotacceptance testing(TIDRLAT)foreverywaferlotto30 krad(Si) •Single-eventeffects(SEE)characterized: –Singleeventlatch-up(SEL)

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V62/23628-01XE

Marking:SC02SEP;Package:TSSOP;SN54SC4T02-SEP Radiation Tolerant, Quadruple 2-Input Positive-NOR Gates

1Features •Vendoritemdrawingavailable,VID V62/23628-01XE •Totalionizingdosecharacterizedat30krad(Si) –Totalionizingdoseradiationlotacceptance testing(TIDRLAT)foreverywaferlotto30 krad(Si) •Single-eventeffects(SEE)characterized: –Singleeventlatch-up(SEL)

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V62/23629-01XE

Marking:SC32SEP;Package:TSSOP;SN54SC4T32-SEP Radiation Tolerant, Quadruple 2-Input Positive-OR Gates With Integrated Translation

1Features •Vendoritemdrawingavailable,VID V62/23629-01XE •Totalionizingdosecharacterizedat30krad(Si) –Totalionizingdoseradiationlotacceptance testing(TIDRLAT)foreverywaferlotto30 krad(Si) •Single-eventeffects(SEE)characterized: –Singleeventlatch-up(SEL)

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V62/23630-01XE

Marking:SC86SEP;Package:TSSOP;SN54SC4T86-SEP Radiation Tolerant, Quadruple 2-Input Exclusive-OR Gates

1Features •Vendoritemdrawingavailable,VID V62/23630-01XE •Totalionizingdosecharacterizedat30krad(Si) –Totalionizingdoseradiationlotacceptance testing(TIDRLAT)foreverywaferlotto30 krad(Si) •Single-eventeffects(SEE)characterized: –Singleeventlatch-up(SEL)

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V62/23632-01XE

Marking:SC74SEP;Package:TSSOP;SN54SC2T74-SEP Radiation Tolerant, Dual D-Type Flip-Flop With Integrated Translation

1Features •Vendoritemdrawingavailable,VID V62/23632-01XE •Totalionizingdosecharacterizedat30krad(Si) –Totalionizingdoseradiationlotacceptance testing(TIDRLAT)foreverywaferlotto30 krad(Si) •Single-eventeffects(SEE)characterized: –Singleeventlatch-up(SEL)

TITexas Instruments

德州仪器美国德州仪器公司

V62/23632-01XE

Marking:SC74SEP;Package:TSSOP;SN54SC2T74-SEP Radiation Tolerant, Dual D-Type Flip-Flop With Integrated Translation

1Features •Vendoritemdrawingavailable,VID V62/23632-01XE •Totalionizingdosecharacterizedat30krad(Si) –Totalionizingdoseradiationlotacceptance testing(TIDRLAT)foreverywaferlotto30 krad(Si) •Single-eventeffects(SEE)characterized: –Singleeventlatch-up(SEL)

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V62/23632-01XE

Marking:SC74SEP;Package:TSSOP;SN54SC2T74-SEP Radiation Tolerant, Dual D-Type Flip-Flop With Integrated Translation

1Features •Vendoritemdrawingavailable,VID V62/23632-01XE •Totalionizingdosecharacterizedat30krad(Si) –Totalionizingdoseradiationlotacceptance testing(TIDRLAT)foreverywaferlotto30 krad(Si) •Single-eventeffects(SEE)characterized: –Singleeventlatch-up(SEL)

TI1Texas Instruments

德州仪器美国德州仪器公司

V62/23632-01XE

Marking:SC74SEP;Package:TSSOP;SN54SC2T74-SEP Radiation Tolerant, Dual D-Type Flip-Flop With Integrated Translation

1Features •Vendoritemdrawingavailable,VID V62/23632-01XE •Totalionizingdosecharacterizedat30krad(Si) –Totalionizingdoseradiationlotacceptance testing(TIDRLAT)foreverywaferlotto30 krad(Si) •Single-eventeffects(SEE)characterized: –Singleeventlatch-up(SEL)

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V62/23633-01XE

Marking:SC97SEP;Package:TSSOP;SN54SC3T97-SEP Radiation Tolerant, Configurable Multiple-Function Gate

1Features •Vendoritemdrawingavailable,VID V62/23633-01XE •Totalionizingdosecharacterizedat30krad(Si) –Totalionizingdoseradiationlotacceptance testing(TIDRLAT)foreverywaferlotto30 krad(Si) •Single-eventeffects(SEE)characterized: –Singleeventlatch-up(SEL)

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V62/24616-01XE

Marking:SC06SEP;Package:TSSOP;SN54SC6T06-SEP Radiation Tolerant, Hex Inverter Buffers/Drivers With Open-Drain Outputs

1Features •Vendoritemdrawingavailable,VIDV62/24616 •Totalionizingdosecharacterizedat30krad(Si) –Totalionizingdoseradiationlotacceptance testing(TIDRLAT)foreverywaferlotto30 krad(Si) •Single-eventeffects(SEE)characterized: –Singleeventlatch-up(SEL)immun

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详细参数

  • 型号:

    SC

  • 制造商:

    Visaton GmbH & Co.KG

  • 功能描述:

    Bulk

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24+
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更多SC供应商 更新时间2025-6-28 15:36:00