| 型号 | 下载 订购 | 功能描述 | 制造商 上传企业 | LOGO |
|---|---|---|---|---|
丝印：TPS7H1111HBL；Package：CFP；TPS7H1111-SP and TPS7H1111-SEP 1.5-A, Ultra-Low Noise, High PSRR Radiation Hardened Low Dropout (LDO) Linear Regulator 1 Features • Total ionizing dose (TID) characterized – Radiation hardness assurance (RHA) availability of 100 krad(Si) or 50 krad(Si) • Single-Event Effects (SEE) characterized – Single-event latchup (SEL), single-event burnout (SEB), and single-event gate rupture (SEGR) immune up to linear 文件：3.85939 Mbytes 页数：68 Pages | TI 德州仪器 | TI | ||
丝印：TPS7H1111HBL；Package：CFP；TPS7H1111-SP and TPS7H1111-SEP 1.5-A, Ultra-Low Noise, High PSRR Radiation Hardened Low Dropout (LDO) Linear Regulator 1 Features • Total ionizing dose (TID) characterized – Radiation hardness assurance (RHA) availability of 100 krad(Si) or 50 krad(Si) • Single-Event Effects (SEE) characterized – Single-event latchup (SEL), single-event burnout (SEB), and single-event gate rupture (SEGR) immune up to linear 文件：3.75129 Mbytes 页数：66 Pages | TI 德州仪器 | TI | ||
丝印：TPS7H1111HBL；Package：CFP；TPS7H1111-SP and TPS7H1111-SEP 1.5-A, Ultra-Low Noise, High PSRR Radiation Hardened Low Dropout (LDO) Linear Regulator 1 Features • Total ionizing dose (TID) characterized – Radiation hardness assurance (RHA) availability of 100 krad(Si) or 50 krad(Si) • Single-Event Effects (SEE) characterized – Single-event latchup (SEL), single-event burnout (SEB), and single-event gate rupture (SEGR) immune up to linear 文件：3.75277 Mbytes 页数：68 Pages | TI 德州仪器 | TI | ||
丝印：TPS7H1111HBL；Package：CFP；TPS7H1111-SP and TPS7H1111-SEP 1.5-A, Ultra-Low Noise, High PSRR Radiation Hardened Low Dropout (LDO) Linear Regulator 1 Features • Total ionizing dose (TID) characterized – Radiation hardness assurance (RHA) availability of 100 krad(Si) or 50 krad(Si) • Single-Event Effects (SEE) characterized – Single-event latchup (SEL), single-event burnout (SEB), and single-event gate rupture (SEGR) immune up to linear 文件：3.85939 Mbytes 页数：68 Pages | TI 德州仪器 | TI | ||
丝印：TPS7H1111HBL；Package：CFP；TPS7H1111-SP and TPS7H1111-SEP 1.5-A, Ultra-Low Noise, High PSRR Radiation Hardened Low Dropout (LDO) Linear Regulator 1 Features • Total ionizing dose (TID) characterized – Radiation hardness assurance (RHA) availability of 100 krad(Si) or 50 krad(Si) • Single-Event Effects (SEE) characterized – Single-event latchup (SEL), single-event burnout (SEB), and single-event gate rupture (SEGR) immune up to linear 文件：3.75129 Mbytes 页数：66 Pages | TI 德州仪器 | TI | ||
丝印：TPS7H1111HBL；Package：CFP；TPS7H1111-SP and TPS7H1111-SEP 1.5-A, Ultra-Low Noise, High PSRR Radiation Hardened Low Dropout (LDO) Linear Regulator 1 Features • Total ionizing dose (TID) characterized – Radiation hardness assurance (RHA) availability of 100 krad(Si) or 50 krad(Si) • Single-Event Effects (SEE) characterized – Single-event latchup (SEL), single-event burnout (SEB), and single-event gate rupture (SEGR) immune up to linear 文件：3.75277 Mbytes 页数：68 Pages | TI 德州仪器 | TI | ||
丝印：TPS7H1111HBL；Package：CFP；TPS7H1111-SP and TPS7H1111-SEP 1.5-A, Ultra-Low Noise, High PSRR Radiation Hardened Low Dropout (LDO) Linear Regulator 1 Features • Total ionizing dose (TID) characterized – Radiation hardness assurance (RHA) availability of 100 krad(Si) or 50 krad(Si) • Single-Event Effects (SEE) characterized – Single-event latchup (SEL), single-event burnout (SEB), and single-event gate rupture (SEGR) immune up to linear 文件：3.85939 Mbytes 页数：68 Pages | TI 德州仪器 | TI | ||
丝印：TPS7H1111HBL；Package：CFP；TPS7H1111-SP and TPS7H1111-SEP 1.5-A, Ultra-Low Noise, High PSRR Radiation Hardened Low Dropout (LDO) Linear Regulator 1 Features • Total ionizing dose (TID) characterized – Radiation hardness assurance (RHA) availability of 100 krad(Si) or 50 krad(Si) • Single-Event Effects (SEE) characterized – Single-event latchup (SEL), single-event burnout (SEB), and single-event gate rupture (SEGR) immune up to linear 文件：3.75129 Mbytes 页数：66 Pages | TI 德州仪器 | TI | ||
丝印：TPS7H1111HBL；Package：CFP；TPS7H1111-SP and TPS7H1111-SEP 1.5-A, Ultra-Low Noise, High PSRR Radiation Hardened Low Dropout (LDO) Linear Regulator 1 Features • Total ionizing dose (TID) characterized – Radiation hardness assurance (RHA) availability of 100 krad(Si) or 50 krad(Si) • Single-Event Effects (SEE) characterized – Single-event latchup (SEL), single-event burnout (SEB), and single-event gate rupture (SEGR) immune up to linear 文件：3.75277 Mbytes 页数：68 Pages | TI 德州仪器 | TI | ||
丝印：TPS7H1111HBL；Package：CFP；TPS7H1111-SP and TPS7H1111-SEP 1.5-A, Ultra-Low Noise, High PSRR Radiation Hardened Low Dropout (LDO) Linear Regulator 1 Features • Total ionizing dose (TID) characterized – Radiation hardness assurance (RHA) availability of 100 krad(Si) or 50 krad(Si) • Single-Event Effects (SEE) characterized – Single-event latchup (SEL), single-event burnout (SEB), and single-event gate rupture (SEGR) immune up to linear 文件：3.85939 Mbytes 页数：68 Pages | TI 德州仪器 | TI |
| 供应商 | 型号 | 品牌 | 批号 | 封装 | 库存 | 备注 | 价格 |
|---|---|---|---|---|---|---|---|
TI(德州仪器) |
2024+ |
N/A |
500000 |
诚信服务,绝对原装原盘 |
询价 | ||
3000 |
原装现货 |
询价 | |||||
TI德州仪器 |
22+ |
24000 |
原装正品现货,实单可谈,量大价优 |
询价 | |||
TI/德州 |
2018+ |
SOIC |
32500 |
VSSOP |
询价 | ||
N/A |
99 |
询价 | |||||
TI/德州仪器 |
23+ |
11200 |
原厂授权一级代理、全球订货优势渠道、可提供一站式BO |
询价 | |||
TI |
16+ |
原厂封装 |
30 |
宇航IC只做原装假一罚十 |
询价 | ||
TI |
24+ |
N/A |
90000 |
原厂正规渠道现货、保证原装正品价格合理 |
询价 | ||
TI |
24+ |
30 |
全新原装 |
询价 | |||
TI |
2017+ |
CFP-16 |
152 |
原装现货,随时可看货! |
询价 |
相关芯片丝印
更多- TPS7H1121HFT/EM
- V62/23608-01XE
- V62SLASH23608-01XE
- TPS7H2201HKR/EM
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- TPS7H2211HKRSLASHEM
- TPS7H3014HFT/EM
- TPS7H3014HFTSLASHEM
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- V62/22615-01XE
- TPS7H3302MDAPTSEP
- V62SLASH22615-01XE
- TPS7H3302MDAPTSEP
- TPS7H4001HKY/EM
- TPS7H4001HKY/EM
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- 5962-1820501VXC
- TPS7H4002HKH/EM
- TPS7H4002HKH/EM
- TPS7H4002HKH/EM
- TPS7H4011HLBSLASHEM
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- TPS7H5001HFT/EM
- TPS7H5001HFT/EM
- TPS7H5001HFTSLASHEM
- TPS7H5001HFTSLASHEM
- TPS7H5001HFTSLASHEM
- TPS7H5002HFT/EM
- TPS7H5002HFTSLASHEM
- TPS7H5002HFT/EM
- TPS7H5002HFTSLASHEM
- TPS7H5003HFT/EM
相关库存
更多- TPS7H1121HFTSLASHEM
- TPS7H2201MDAPTSEP
- TPS7H2201MDAPTSEP
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- TPS7H2201HKR/EM
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- TPS7H2201HKRSLASHEM
- TPS7H2201HKRSLASHEM
- 5962R1722001VXC
- V62/23609-01XE
- TPS7H2211MDAPTSEP
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- TPS7H2211HKR/EM
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- TPS7H2211HKRSLASHEM
- TPS7H2211HKR/EM
- TPS7H3014HFTSLASHEM
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- TPS7H3301HKRSLASHEM
- TPS7H3302MDAPTSEP
- V62/22615-01XE
- V62SLASH22615-01XE
- TPS7H4001HKY/EM
- TPS7H4001HKY/EM
- TPS7H4001HKY/EM
- TPS7H4001HKYSLASHEM
- TPS7H4001HKYSLASHEM
- TPS7H4001MDDWTSHP
- 5962-1820501VXC
- TPS7H4002HKHSLASHEM
- TPS7H4002HKHSLASHEM
- TPS7H4011HLB/EM
- TPS7H4011HLB/EM
- TPS7H5001HFT/EM
- TPS7H5001HFT/EM
- TPS7H5001HFTSLASHEM
- TPS7H5001HFTSLASHEM
- TPS7H5001HFT/EM
- TPS7H5002HFT/EM
- TPS7H5002HFTSLASHEM
- TPS7H5002HFTSLASHEM
- TPS7H5002HFT/EM
- TPS7H5003HFT/EM
- TPS7H5003HFT/EM
