首页 >丝印反查>TPS7H1121HFT

型号下载 订购功能描述制造商 上传企业LOGO

TPS7H1121HFT/EM

丝印:TPS7H1121HFT;Package:CFP;TPS7H1121-SP 2.25V to 14V Input, 2A, Radiation Hardened Low Dropout (LDO) Linear Regulator

1 Features • Total Ionizing Dose radiation characterized: – Radiation hardness assurance (RHA) availability of 100krad(Si) or 50krad(Si) • Single-Event Effects (SEE) Characterized – Single-event latch-up (SEL), single-event burnout (SEB), and single-event gate rupture (SEGR) immune to linea

文件:2.47474 Mbytes 页数:40 Pages

TI

德州仪器

TPS7H1121HFTSLASHEM

丝印:TPS7H1121HFT;Package:CFP;TPS7H1121-SP 2.25V to 14V Input, 2A, Radiation Hardened Low Dropout (LDO) Linear Regulator

1 Features • Total Ionizing Dose radiation characterized: – Radiation hardness assurance (RHA) availability of 100krad(Si) or 50krad(Si) • Single-Event Effects (SEE) Characterized – Single-event latch-up (SEL), single-event burnout (SEB), and single-event gate rupture (SEGR) immune to linea

文件:2.47474 Mbytes 页数:40 Pages

TI

德州仪器

TPS7H1121HFT/EM

丝印:TPS7H1121HFT;Package:CFP;TPS7H1121-SP 2.25V to 14V Input, 2A, Radiation Hardened Low Dropout (LDO) Linear Regulator

1 Features • Total Ionizing Dose radiation characterized: – Radiation hardness assurance (RHA) availability of 100krad(Si) or 50krad(Si) • Single-Event Effects (SEE) Characterized – Single-event latch-up (SEL), single-event burnout (SEB), and single-event gate rupture (SEGR) immune to linea

文件:2.47474 Mbytes 页数:40 Pages

TI

德州仪器

TPS7H1121HFTSLASHEM

丝印:TPS7H1121HFT;Package:CFP;TPS7H1121-SP 2.25V to 14V Input, 2A, Radiation Hardened Low Dropout (LDO) Linear Regulator

1 Features • Total Ionizing Dose radiation characterized: – Radiation hardness assurance (RHA) availability of 100krad(Si) or 50krad(Si) • Single-Event Effects (SEE) Characterized – Single-event latch-up (SEL), single-event burnout (SEB), and single-event gate rupture (SEGR) immune to linea

文件:2.47474 Mbytes 页数:40 Pages

TI

德州仪器

TPS7H1121HFT/EM

TPS7H1121-SP 2.25V to 14V Input, 2A, Radiation Hardened Low Dropout (LDO) Linear Regulator

1 Features • Total Ionizing Dose radiation characterized: – Radiation hardness assurance (RHA) availability of 100krad(Si) or 50krad(Si) • Single-Event Effects (SEE) Characterized – Single-event latch-up (SEL), single-event burnout (SEB), and single-event gate rupture (SEGR) immune to linea

文件:2.51134 Mbytes 页数:39 Pages

TI

德州仪器

TPS7H1121HFTSLASHEM

TPS7H1121-SP 2.25V to 14V Input, 2A, Radiation Hardened Low Dropout (LDO) Linear Regulator

1 Features • Total Ionizing Dose radiation characterized: – Radiation hardness assurance (RHA) availability of 100krad(Si) or 50krad(Si) • Single-Event Effects (SEE) Characterized – Single-event latch-up (SEL), single-event burnout (SEB), and single-event gate rupture (SEGR) immune to linea

文件:2.51134 Mbytes 页数:39 Pages

TI

德州仪器

供应商型号品牌批号封装库存备注价格
3000
原装现货
询价
TI德州仪器
22+
24000
原装正品现货,实单可谈,量大价优
询价
TI/德州
2018+
SOIC
32500
VSSOP
询价
N/A
99
询价
TI
22+
NA
500000
万三科技,秉承原装,购芯无忧
询价
TI/德州仪器
23+
11200
原厂授权一级代理、全球订货优势渠道、可提供一站式BO
询价
TI(德州仪器)
2024+
N/A
500000
诚信服务,绝对原装原盘
询价
TI
16+
原厂封装
30
宇航IC只做原装假一罚十
询价
TI
24+
N/A
90000
原厂正规渠道现货、保证原装正品价格合理
询价
TI
24+
30
全新原装
询价
更多TPS7H1121HFT供应商 更新时间2025-5-26 11:46:00