| 型号 | 下载 订购 | 功能描述 | 制造商 上传企业 | LOGO |
|---|---|---|---|---|
TPS7H4011HLB/EM | 丝印：TPS7H4011HLB/EM；Package：CFP；TPS7H4011-SP and TPS7H4011-SEP 4.5V to 14V Input 12A Radiation Hardened Synchronous Buck Converter 1 Features • Total ionizing dose (TID) characterized – Radiation hardness assurance (RHA) availability of up to 100krad(Si) • Single-Event Effects (SEE) characterized – Single-event latchup (SEL), single-event burnout (SEB), and single-event gate rupture (SEGR) immune up to linear energy tr 文件：3.67718 Mbytes 页数：76 Pages | TI 德州仪器 | TI | |
TPS7H4011HLB/EM | 丝印：TPS7H4011HLB/EM；Package：CFP；TPS7H4011-SP and TPS7H4011-SEP 4.5V to 14V Input 12A Radiation Hardened Synchronous Buck Converter 1 Features • Total ionizing dose (TID) characterized – Radiation hardness assurance (RHA) availability of up to 100krad(Si) • Single-Event Effects (SEE) characterized – Single-event latchup (SEL), single-event burnout (SEB), and single-event gate rupture (SEGR) immune up to linear energy tr 文件：3.55169 Mbytes 页数：79 Pages | TI 德州仪器 | TI | |
丝印：TPS7H4011HLB/EM；Package：CFP；TPS7H4011-SP and TPS7H4011-SEP 4.5V to 14V Input 12A Radiation Hardened Synchronous Buck Converter 1 Features • Total ionizing dose (TID) characterized – Radiation hardness assurance (RHA) availability of up to 100krad(Si) • Single-Event Effects (SEE) characterized – Single-event latchup (SEL), single-event burnout (SEB), and single-event gate rupture (SEGR) immune up to linear energy tr 文件：3.55169 Mbytes 页数：79 Pages | TI 德州仪器 | TI | ||
丝印：TPS7H4011HLB/EM；Package：CFP；TPS7H4011-SP and TPS7H4011-SEP 4.5V to 14V Input 12A Radiation Hardened Synchronous Buck Converter 1 Features • Total ionizing dose (TID) characterized – Radiation hardness assurance (RHA) availability of up to 100krad(Si) • Single-Event Effects (SEE) characterized – Single-event latchup (SEL), single-event burnout (SEB), and single-event gate rupture (SEGR) immune up to linear energy tr 文件：3.67718 Mbytes 页数：76 Pages | TI 德州仪器 | TI | ||
TPS7H4011HLB/EM | 丝印：TPS7H4011HLB/EM；Package：CFP；TPS7H4011-SP and TPS7H4011-SEP 4.5V to 14V Input 12A Radiation Hardened Synchronous Buck Converter 1 Features • Total ionizing dose (TID) characterized – Radiation hardness assurance (RHA) availability of up to 100krad(Si) • Single-Event Effects (SEE) characterized – Single-event latchup (SEL), single-event burnout (SEB), and single-event gate rupture (SEGR) immune up to linear energy tr 文件：3.67718 Mbytes 页数：76 Pages | TI 德州仪器 | TI | |
TPS7H4011HLB/EM | 丝印：TPS7H4011HLB/EM；Package：CFP；TPS7H4011-SP and TPS7H4011-SEP 4.5V to 14V Input 12A Radiation Hardened Synchronous Buck Converter 1 Features • Total ionizing dose (TID) characterized – Radiation hardness assurance (RHA) availability of up to 100krad(Si) • Single-Event Effects (SEE) characterized – Single-event latchup (SEL), single-event burnout (SEB), and single-event gate rupture (SEGR) immune up to linear energy tr 文件：3.55169 Mbytes 页数：79 Pages | TI 德州仪器 | TI | |
TPS7H4011HLB/EM | TPS7H4011-SP and TPS7H4011-SEP 4.5V to 14V Input 12A Radiation Hardened Synchronous Buck Converter 1 Features • Total ionizing dose (TID) characterized – Radiation hardness assurance (RHA) availability of up to 100krad(Si) • Single-Event Effects (SEE) characterized – Single-event latchup (SEL), single-event burnout (SEB), and single-event gate rupture (SEGR) immune up to linear energy tr 文件：2.70879 Mbytes 页数：66 Pages | TI 德州仪器 | TI |
| 供应商 | 型号 | 品牌 | 批号 | 封装 | 库存 | 备注 | 价格 |
|---|---|---|---|---|---|---|---|
TI(德州仪器) |
2024+ |
N/A |
500000 |
诚信服务,绝对原装原盘 |
询价 | ||
TI |
25+ |
CFP (HFT) |
6000 |
原厂原装,价格优势 |
询价 | ||
TI |
23+ |
5000 |
全新原装正品现货 |
询价 | |||
TI德州仪器 |
22+ |
24000 |
原装正品现货,实单可谈,量大价优 |
询价 | |||
24+ |
N/A |
47000 |
一级代理-主营优势-实惠价格-不悔选择 |
询价 | |||
TI/德州仪器 |
25+ |
原厂封装 |
10280 |
原厂授权代理,专注军工、汽车、医疗、工业、新能源！ |
询价 | ||
TI/德州仪器 |
25+ |
原厂封装 |
10280 |
询价 | |||
TI/德州仪器 |
25+ |
原厂封装 |
11000 |
询价 | |||
TI/德州仪器 |
25+ |
原厂封装 |
10280 |
询价 | |||
TI/德州仪器 |
25+ |
原厂封装 |
9999 |
询价 |
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