丝印：ABT18245A；Package：SSOP；SCAN TEST DEVICES WITH 18-BIT BUS TRANSCEIVERS

Members of the Texas Instruments SCOPE E Family of Testability Products Members of the Texas Instruments WidebusE Family Compatible With the IEEE Standard 1149.1-1990 (JTAG) Test Access Port and Boundary-Scan Architecture SCOPE E Instruction Set – IEEE Standard 1149.1-1990 Required Instru

文件：1.38302 Mbytes 页数：38 Pages

TI

德州仪器

丝印：ABT16823；Package：SSOP；SCAN TEST DEVICES WITH 18-BIT BUS TRANSCEIVERS

Members of the Texas Instruments SCOPE E Family of Testability Products Members of the Texas Instruments WidebusE Family Compatible With the IEEE Standard 1149.1-1990 (JTAG) Test Access Port and Boundary-Scan Architecture SCOPE E Instruction Set – IEEE Standard 1149.1-1990 Required Instru

文件：868.21 Kbytes 页数：38 Pages

TI

德州仪器

SCAN TEST DEVICE WITH 18-BIT REGISTERED BUS TRANSCEIVER

Member of the Texas Instruments Widebus Family UBT Transceiver Combines D-Type Latches and D-Type Flip-Flops for Operation in Transparent, Latched, or Clocked Mode Compatible With IEEE Std 1149.1-1990 (JTAG) Test Access Port (TAP) and Boundary-Scan Architecture Includes D-Type Flip-Flop

文件：698.03 Kbytes 页数：36 Pages

TI

德州仪器

丝印：ABT18502；Package：LQFP；SCAN TEST DEVICE WITH 18-BIT REGISTERED BUS TRANSCEIVER

Member of the Texas Instruments Widebus Family UBT Transceiver Combines D-Type Latches and D-Type Flip-Flops for Operation in Transparent, Latched, or Clocked Mode Compatible With IEEE Std 1149.1-1990 (JTAG) Test Access Port (TAP) and Boundary-Scan Architecture Includes D-Type Flip-Flop

文件：698.03 Kbytes 页数：36 Pages

TI

德州仪器

丝印：ABT18502；Package：LQFP；SCAN TEST DEVICE WITH 18-BIT REGISTERED BUS TRANSCEIVER

Member of the Texas Instruments Widebus Family UBT Transceiver Combines D-Type Latches and D-Type Flip-Flops for Operation in Transparent, Latched, or Clocked Mode Compatible With IEEE Std 1149.1-1990 (JTAG) Test Access Port (TAP) and Boundary-Scan Architecture Includes D-Type Flip-Flop

文件：698.03 Kbytes 页数：36 Pages

TI

德州仪器

丝印：ABT18502；Package：LQFP；SCAN TEST DEVICE WITH 18-BIT REGISTERED BUS TRANSCEIVER

Member of the Texas Instruments Widebus Family UBT Transceiver Combines D-Type Latches and D-Type Flip-Flops for Operation in Transparent, Latched, or Clocked Mode Compatible With IEEE Std 1149.1-1990 (JTAG) Test Access Port (TAP) and Boundary-Scan Architecture Includes D-Type Flip-Flop

文件：698.03 Kbytes 页数：36 Pages

TI

德州仪器

丝印：ABT18502；Package：LQFP；SCAN TEST DEVICE WITH 18-BIT REGISTERED BUS TRANSCEIVER

Member of the Texas Instruments Widebus Family UBT Transceiver Combines D-Type Latches and D-Type Flip-Flops for Operation in Transparent, Latched, or Clocked Mode Compatible With IEEE Std 1149.1-1990 (JTAG) Test Access Port (TAP) and Boundary-Scan Architecture Includes D-Type Flip-Flop

文件：698.03 Kbytes 页数：36 Pages

TI

德州仪器

丝印：ABT18502；Package：LQFP；SCAN TEST DEVICE WITH 18-BIT REGISTERED BUS TRANSCEIVER

Member of the Texas Instruments Widebus Family UBT Transceiver Combines D-Type Latches and D-Type Flip-Flops for Operation in Transparent, Latched, or Clocked Mode Compatible With IEEE Std 1149.1-1990 (JTAG) Test Access Port (TAP) and Boundary-Scan Architecture Includes D-Type Flip-Flop

文件：698.03 Kbytes 页数：36 Pages

TI

德州仪器

SCAN TEST DEVICES WITH 20-BIT UNIVERSAL BUS TRANSCEIVERS

Members of the Texas Instruments SCOPE E Family of Testability Products Members of the Texas Instruments Widebus E Family Compatible With the IEEE Standard 1149.1-1990 (JTAG) Test Access Port and Boundary-Scan Architecture UBT E (Universal Bus Transceiver) Combines D-Type Latches and D-Typ

文件：716.62 Kbytes 页数：35 Pages

TI

德州仪器

丝印：ABT18504；Package：LQFP；SCAN TEST DEVICES WITH 20-BIT UNIVERSAL BUS TRANSCEIVERS

Members of the Texas Instruments SCOPE E Family of Testability Products Members of the Texas Instruments Widebus E Family Compatible With the IEEE Standard 1149.1-1990 (JTAG) Test Access Port and Boundary-Scan Architecture UBT E (Universal Bus Transceiver) Combines D-Type Latches and D-Typ

文件：716.62 Kbytes 页数：35 Pages

TI

德州仪器