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SN74ABT18502PM

丝印:ABT18502;Package:LQFP;SCAN TEST DEVICE WITH 18-BIT REGISTERED BUS TRANSCEIVER

Member of the Texas Instruments Widebus Family UBT Transceiver Combines D-Type Latches and D-Type Flip-Flops for Operation in Transparent, Latched, or Clocked Mode Compatible With IEEE Std 1149.1-1990 (JTAG) Test Access Port (TAP) and Boundary-Scan Architecture Includes D-Type Flip-Flop

文件:698.03 Kbytes 页数:36 Pages

TI

德州仪器

SN74ABT18502PM.B

丝印:ABT18502;Package:LQFP;SCAN TEST DEVICE WITH 18-BIT REGISTERED BUS TRANSCEIVER

Member of the Texas Instruments Widebus Family UBT Transceiver Combines D-Type Latches and D-Type Flip-Flops for Operation in Transparent, Latched, or Clocked Mode Compatible With IEEE Std 1149.1-1990 (JTAG) Test Access Port (TAP) and Boundary-Scan Architecture Includes D-Type Flip-Flop

文件:698.03 Kbytes 页数:36 Pages

TI

德州仪器

SN74ABT18502PMG4.B

丝印:ABT18502;Package:LQFP;SCAN TEST DEVICE WITH 18-BIT REGISTERED BUS TRANSCEIVER

Member of the Texas Instruments Widebus Family UBT Transceiver Combines D-Type Latches and D-Type Flip-Flops for Operation in Transparent, Latched, or Clocked Mode Compatible With IEEE Std 1149.1-1990 (JTAG) Test Access Port (TAP) and Boundary-Scan Architecture Includes D-Type Flip-Flop

文件:698.03 Kbytes 页数:36 Pages

TI

德州仪器

SN74ABT18502PMR

丝印:ABT18502;Package:LQFP;SCAN TEST DEVICE WITH 18-BIT REGISTERED BUS TRANSCEIVER

Member of the Texas Instruments Widebus Family UBT Transceiver Combines D-Type Latches and D-Type Flip-Flops for Operation in Transparent, Latched, or Clocked Mode Compatible With IEEE Std 1149.1-1990 (JTAG) Test Access Port (TAP) and Boundary-Scan Architecture Includes D-Type Flip-Flop

文件:698.03 Kbytes 页数:36 Pages

TI

德州仪器

SN74ABT18502PMR.B

丝印:ABT18502;Package:LQFP;SCAN TEST DEVICE WITH 18-BIT REGISTERED BUS TRANSCEIVER

Member of the Texas Instruments Widebus Family UBT Transceiver Combines D-Type Latches and D-Type Flip-Flops for Operation in Transparent, Latched, or Clocked Mode Compatible With IEEE Std 1149.1-1990 (JTAG) Test Access Port (TAP) and Boundary-Scan Architecture Includes D-Type Flip-Flop

文件:698.03 Kbytes 页数:36 Pages

TI

德州仪器

ABT18502

SCAN TEST DEVICE WITH 18-BIT REGISTERED BUS TRANSCEIVER

文件:433.54 Kbytes 页数:30 Pages

TI

德州仪器

详细参数

  • 型号:

    ABT18502

  • 功能描述:

    特定功能逻辑 W/18-Bit Univ Bus Trncvr

  • RoHS:

  • 制造商:

    Texas Instruments

  • 系列:

    SN74ABTH18502A

  • 工作电源电压:

    5 V

  • 封装/箱体:

    LQFP-64

  • 封装:

    Tube

供应商型号品牌批号封装库存备注价格
TI(德州仪器)
24+
LQFP64(10x10)
1019
只做原装,提供一站式配单服务,代工代料。BOM配单
询价
TI/德州仪器
25+
QFP
4000
询价
TI
24+
6
询价
TexasInstruments
18+
ICSCAN-TEST-DEV/TXRX64-L
6800
公司原装现货/欢迎来电咨询!
询价
Texas Instruments
24+
64-LQFP(10x10)
56200
一级代理/放心采购
询价
TI
20+
QFP-64
284
就找我吧!--邀您体验愉快问购元件!
询价
TI(德州仪器)
2021+
LQFP-64(10x10)
499
询价
TI
23+
N/A
560
原厂原装
询价
22+
NA
177
加我QQ或微信咨询更多详细信息,
询价
TI
22+
64LQFP
9000
原厂渠道,现货配单
询价
更多ABT18502供应商 更新时间2025-9-19 11:43:00