SCAN TEST DEVICE WITH 18-BIT REGISTERED BUS TRANSCEIVER

Member of the Texas Instruments Widebus Family UBT Transceiver Combines D-Type Latches and D-Type Flip-Flops for Operation in Transparent, Latched, or Clocked Mode Compatible With IEEE Std 1149.1-1990 (JTAG) Test Access Port (TAP) and Boundary-Scan Architecture Includes D-Type Flip-Flop

文件：698.03 Kbytes 页数：36 Pages

TI

德州仪器

SCAN TEST DEVICE WITH 18-BIT REGISTERED BUS TRANSCEIVER

文件：384.62 Kbytes 页数：28 Pages

TI

德州仪器

SCAN TEST DEVICE WITH 18-BIT REGISTERED BUS TRANSCEIVER

文件：433.54 Kbytes 页数：30 Pages

TI

德州仪器

SCAN TEST DEVICE WITH 18-BIT REGISTERED BUS TRANSCEIVER

文件：487.82 Kbytes 页数：32 Pages

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德州仪器

具有 18 位通用总线收发器的扫描测试设备

The SN74ABT18502 scan test device with an 18-bit universal bus transceiver is a member of the Texas Instruments SCOPE™ testability IC family. This family of devices supports IEEE Std 1149.1-1990 boundary scan to facilitate testing of complex circuit board assemblies. Scan access to the test circuitr • Member of the Texas Instruments Widebus™ Family\n• Compatible With IEEE Std 1149.1-1990 (JTAG) Test Access Port (TAP) and Boundary-Scan Architecture\n• Two Boundary-Scan Cells (BSCs) Per I/O for Greater Flexibility\n• Parallel Signature Analysis (PSA) at Inputs With Masking Option\n• Sample Inputs;

TI

德州仪器

丝印：ABT18502；Package：LQFP；SCAN TEST DEVICE WITH 18-BIT REGISTERED BUS TRANSCEIVER

Member of the Texas Instruments Widebus Family UBT Transceiver Combines D-Type Latches and D-Type Flip-Flops for Operation in Transparent, Latched, or Clocked Mode Compatible With IEEE Std 1149.1-1990 (JTAG) Test Access Port (TAP) and Boundary-Scan Architecture Includes D-Type Flip-Flop

文件：698.03 Kbytes 页数：36 Pages

TI

德州仪器

丝印：ABT18502；Package：LQFP；SCAN TEST DEVICE WITH 18-BIT REGISTERED BUS TRANSCEIVER

Member of the Texas Instruments Widebus Family UBT Transceiver Combines D-Type Latches and D-Type Flip-Flops for Operation in Transparent, Latched, or Clocked Mode Compatible With IEEE Std 1149.1-1990 (JTAG) Test Access Port (TAP) and Boundary-Scan Architecture Includes D-Type Flip-Flop

文件：698.03 Kbytes 页数：36 Pages

TI

德州仪器

丝印：ABT18502；Package：LQFP；SCAN TEST DEVICE WITH 18-BIT REGISTERED BUS TRANSCEIVER

Member of the Texas Instruments Widebus Family UBT Transceiver Combines D-Type Latches and D-Type Flip-Flops for Operation in Transparent, Latched, or Clocked Mode Compatible With IEEE Std 1149.1-1990 (JTAG) Test Access Port (TAP) and Boundary-Scan Architecture Includes D-Type Flip-Flop

文件：698.03 Kbytes 页数：36 Pages

TI

德州仪器

丝印：ABT18502；Package：LQFP；SCAN TEST DEVICE WITH 18-BIT REGISTERED BUS TRANSCEIVER

Member of the Texas Instruments Widebus Family UBT Transceiver Combines D-Type Latches and D-Type Flip-Flops for Operation in Transparent, Latched, or Clocked Mode Compatible With IEEE Std 1149.1-1990 (JTAG) Test Access Port (TAP) and Boundary-Scan Architecture Includes D-Type Flip-Flop

文件：698.03 Kbytes 页数：36 Pages

TI

德州仪器

丝印：ABT18502；Package：LQFP；SCAN TEST DEVICE WITH 18-BIT REGISTERED BUS TRANSCEIVER

Member of the Texas Instruments Widebus Family UBT Transceiver Combines D-Type Latches and D-Type Flip-Flops for Operation in Transparent, Latched, or Clocked Mode Compatible With IEEE Std 1149.1-1990 (JTAG) Test Access Port (TAP) and Boundary-Scan Architecture Includes D-Type Flip-Flop

文件：698.03 Kbytes 页数：36 Pages

TI

德州仪器