SMD Power Inductors Unshielded

文件：435.57 Kbytes 页数：17 Pages

PREMO

普莱默

N-Channel Switch

N-Channel Switch This device is designed for analog or digital switching applications where very low On Resistance is mandatory. Sourced from Process 58. See J108 for characteristics.

文件：300.7 Kbytes 页数：7 Pages

FAIRCHILD

仙童半导体

N-Channel Switch

N-Channel Switch This device is designed for analog or digital switching applications where very low On Resistance is mandatory. Sourced from Process 58. See J108 for characteristics.

文件：300.7 Kbytes 页数：7 Pages

FAIRCHILD

仙童半导体

N-Channel Switch

N-Channel Switch This device is designed for analog or digital switching applications where very low On Resistance is mandatory. Sourced from Process 58. See J108 for characteristics.

文件：300.7 Kbytes 页数：7 Pages

FAIRCHILD

仙童半导体

恩XP NFC controller PN544 for mobile phones and portable equipment

Introduction This Objective short data sheet describes the functionality of the controller IC PN544. It includes functional and electrical specifications. A complete specification will be given in the product data sheet. General description The PN544 is a highly integrated NFC controller IC for

文件：1.98604 Mbytes 页数：4 Pages

恩XP

SN54SC1G08-SEP Radiation Tolerant, Single 2-Input Positive-AND Gate

1 Features • VID TBD-01XE • Radiation - Total Ionizing Dose (TID): – TID characterized up to 50krad(Si) – TID performance assurance up to 30krad(Si) – Radiation Lot Acceptance Testing (RLAT) for every wafer lot up to 30krad(Si) • Radiation - Single-Event Effects (SEE): – Single Event Latch

文件：1.03441 Mbytes 页数：25 Pages

TI

德州仪器

SN54SC8T138-SEP Radiation Tolerant, 3-line to 8-line Decoder/Demultiplexer With Logic Level Shifter

1 Features • Vendor item drawing available, VID V62/25622-01XE • Radiation - Total Ionizing Dose (TID): – TID characterized up to 50 krad(Si) – TID performance assurance up to 30 krad(Si) – Radiation Lot Acceptance Testing (RLAT) for every wafer lot up to 30 krad(Si) • Radiation - Single-E

文件：1.09984 Mbytes 页数：27 Pages

TI

德州仪器

SN54SC8T138-SEP Radiation Tolerant, 3-line to 8-line Decoder/Demultiplexer With Logic Level Shifter

1 Features • VID TBD • Radiation Tolerant: – Single Event Latch-Up (SEL) immune up to 43MeV-cm2/mg at 125°C – Total Ionizing Does (TID) Radiation Lot Acceptance Testing (RLAT) for every wafer lot up to 30 krad(Si) – Single Event Transient (SET) characterized up to LET = 43MeV-cm2/mg • Wi

文件：1.11267 Mbytes 页数：26 Pages

TI

德州仪器

SN54SC8T541-SEP Radiation Tolerant, Octal Buffers and Line Drivers With 3-State Outputs and Logic Level Shifter

1 Features • VID TBD • Radiation Tolerant: – Single Event Latch-Up (SEL) immune up to 43MeV-cm2/mg at 125°C – Total Ionizing Does (TID) Radiation Lot Acceptance Testing (RLAT) for every wafer lot up to 30 krad(Si) – Single Event Transient (SET) characterized up to LET = 43MeV-cm2/mg • Wi

文件：1.25547 Mbytes 页数：27 Pages

TI

德州仪器

SN54SC8T541-SEP Radiation Tolerant, Octal Buffers and Line Drivers With 3-State Outputs and Logic Level Shifter

1 Features • Vendor item drawing available, VID V62/25632-01XE • Radiation - Total Ionizing Dose (TID): – TID characterized up to 50krad(Si) – TID performance assurance up to 30krad(Si) – Radiation Lot Acceptance Testing (RLAT) for every wafer lot up to 30krad(Si) • Radiation - Single-Even

文件：1.1293 Mbytes 页数：27 Pages

TI

德州仪器