SN54SC1G08-SEP Radiation Tolerant, Single 2-Input Positive-AND Gate

1 Features • VID TBD-01XE • Radiation - Total Ionizing Dose (TID): – TID characterized up to 50krad(Si) – TID performance assurance up to 30krad(Si) – Radiation Lot Acceptance Testing (RLAT) for every wafer lot up to 30krad(Si) • Radiation - Single-Event Effects (SEE): – Single Event Latch

文件：1.03441 Mbytes 页数：25 Pages

TI

德州仪器

SN54SC1G08-SEP Radiation Tolerant, Single 2-Input Positive-AND Gate

1 Features • VID TBD-01XE • Radiation - Total Ionizing Dose (TID): – TID characterized up to 50krad(Si) – TID performance assurance up to 30krad(Si) – Radiation Lot Acceptance Testing (RLAT) for every wafer lot up to 30krad(Si) • Radiation - Single-Event Effects (SEE): – Single Event Latch

文件：1.03441 Mbytes 页数：25 Pages

TI

德州仪器

SOP7

芯朋

上传：上海闻业电子科技有限公司

SOP-7

芯朋微

上传：上海闻业电子科技有限公司

SMD

恩XP

上传：深圳市兴联达电子有限公司(原兴达电子)