首页 >LMG3422R050>规格书列表
| 型号 | 下载 订购 | 功能描述 | 制造商 上传企业 | LOGO |
|---|---|---|---|---|
LMG3422R050 | LMG342xR050 600-V 50-m廓 GaN FET With Integrated Driver, Protection, and Temperature Reporting 1 Features • Qualified for JEDEC JEP180 for hard-switching topologies • 600-V GaN-on-Si FET with Integrated gate driver – Integrated high precision gate bias voltage – 200-V/ns CMTI – 3.6-MHz switching frequency – 20-V/ns to 150-V/ns slew rate for optimization of switching performance and 文件:2.090719 Mbytes 页数:49 Pages | TI 德州仪器 | TI | |
LMG3422R050 | LMG342xR050 600V 50mΩ GaN FET With Integrated Driver, Protection, and Temperature Reporting 1 Features • Qualified for JEDEC JEP180 for hard-switching topologies • 600V GaN-on-Si FET with integrated gate driver – Integrated high precision gate bias voltage – 200V/ns FET hold-off – 3.6MHz switching frequency – 20V/ns to 150V/ns slew rate for optimization of switching performance a 文件:2.8057 Mbytes 页数:54 Pages | TI 德州仪器 | TI | |
LMG3422R050 | LMG342xR050 600V 50mΩ GaN FET With Integrated Driver, Protection, and Temperature Reporting 1 Features • Qualified for JEDEC JEP180 for hard-switching topologies • 600V GaN-on-Si FET with integrated gate driver – Integrated high precision gate bias voltage – 200V/ns FET hold-off – 3.6MHz switching frequency – 20V/ns to 150V/ns slew rate for optimization of switching performance a 文件:2.85082 Mbytes 页数:58 Pages | TI 德州仪器 | TI | |
LMG3422R050 | LMG342xR050 600-V 50-m廓 GaN FET with Integrated Driver, Protection, and Temperature Reporting 文件:1.30859 Mbytes 页数:36 Pages | TI 德州仪器 | TI | |
丝印:LMG3422R050;Package:VQFN;LMG342xR050 600-V 50-m廓 GaN FET With Integrated Driver, Protection, and Temperature Reporting 1 Features • Qualified for JEDEC JEP180 for hard-switching topologies • 600-V GaN-on-Si FET with Integrated gate driver – Integrated high precision gate bias voltage – 200-V/ns CMTI – 3.6-MHz switching frequency – 20-V/ns to 150-V/ns slew rate for optimization of switching performance and 文件:2.090719 Mbytes 页数:49 Pages | TI 德州仪器 | TI | ||
丝印:LMG3422R050;Package:VQFN;LMG342xR050 600V 50mΩ GaN FET With Integrated Driver, Protection, and Temperature Reporting 1 Features • Qualified for JEDEC JEP180 for hard-switching topologies • 600V GaN-on-Si FET with integrated gate driver – Integrated high precision gate bias voltage – 200V/ns FET hold-off – 3.6MHz switching frequency – 20V/ns to 150V/ns slew rate for optimization of switching performance a 文件:2.8057 Mbytes 页数:54 Pages | TI 德州仪器 | TI | ||
丝印:LMG3422R050;Package:VQFN(RQZ);LMG342xR050 600V 50mΩ GaN FET With Integrated Driver, Protection, and Temperature Reporting 1 Features • Qualified for JEDEC JEP180 for hard-switching topologies • 600V GaN-on-Si FET with integrated gate driver – Integrated high precision gate bias voltage – 200V/ns FET hold-off – 3.6MHz switching frequency – 20V/ns to 150V/ns slew rate for optimization of switching performance a 文件:2.85082 Mbytes 页数:58 Pages | TI 德州仪器 | TI | ||
丝印:LMG3422R050;Package:VQFN(RQZ);LMG342xR050 600V 50mΩ GaN FET With Integrated Driver, Protection, and Temperature Reporting 1 Features • Qualified for JEDEC JEP180 for hard-switching topologies • 600V GaN-on-Si FET with integrated gate driver – Integrated high precision gate bias voltage – 200V/ns FET hold-off – 3.6MHz switching frequency – 20V/ns to 150V/ns slew rate for optimization of switching performance a 文件:2.85082 Mbytes 页数:58 Pages | TI 德州仪器 | TI | ||
丝印:LMG3422R050;Package:VQFN(RQZ);LMG342xR050 600V 50mΩ GaN FET With Integrated Driver, Protection, and Temperature Reporting 1 Features • Qualified for JEDEC JEP180 for hard-switching topologies • 600V GaN-on-Si FET with integrated gate driver – Integrated high precision gate bias voltage – 200V/ns FET hold-off – 3.6MHz switching frequency – 20V/ns to 150V/ns slew rate for optimization of switching performance a 文件:2.85082 Mbytes 页数:58 Pages | TI 德州仪器 | TI | ||
丝印:LMG3422R050;Package:VQFN;LMG342xR050 600V 50mΩ GaN FET With Integrated Driver, Protection, and Temperature Reporting 1 Features • Qualified for JEDEC JEP180 for hard-switching topologies • 600V GaN-on-Si FET with integrated gate driver – Integrated high precision gate bias voltage – 200V/ns FET hold-off – 3.6MHz switching frequency – 20V/ns to 150V/ns slew rate for optimization of switching performance a 文件:2.8057 Mbytes 页数:54 Pages | TI 德州仪器 | TI |
技术参数
- VDS (Max) (V):
600
- ID (Max) (A):
44
- Rating:
Catalog
| 供应商 | 型号 | 品牌 | 批号 | 封装 | 库存 | 备注 | 价格 |
|---|---|---|---|---|---|---|---|
TI德州仪器 |
22+ |
24000 |
原装正品现货,实单可谈,量大价优 |
询价 | |||
TI |
25+ |
(RQZ) |
6000 |
原厂原装,价格优势 |
询价 | ||
24+ |
6000 |
全新原厂原装正品现货,低价出售,实单可谈 |
询价 | ||||
TI/德州仪器 |
25+ |
原厂封装 |
10280 |
原厂授权代理,专注军工、汽车、医疗、工业、新能源! |
询价 | ||
TI/德州仪器 |
25+ |
原厂封装 |
10280 |
询价 | |||
TI/德州仪器 |
25+ |
原厂封装 |
9999 |
询价 | |||
TI/德州仪器 |
25+ |
原厂封装 |
11000 |
询价 | |||
TI/德州仪器 |
25+ |
原厂封装 |
10280 |
询价 | |||
TI/德州仪器 |
2450+ |
VQFN54 |
9850 |
只做原厂原装正品现货或订货假一赔十! |
询价 | ||
TI(德州仪器) |
25+ |
VQFN-54(12x12) |
500000 |
源自原厂成本,高价回收工厂呆滞 |
询价 |
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