丝印：7H1111PWP；Package：HTSSOP；TPS7H1111-SP and TPS7H1111-SEP 1.5-A, Ultra-Low Noise, High PSRR Radiation Hardened Low Dropout (LDO) Linear Regulator

1 Features • Total ionizing dose (TID) characterized – Radiation hardness assurance (RHA) availability of 100 krad(Si) or 50 krad(Si) • Single-Event Effects (SEE) characterized – Single-event latchup (SEL), single-event burnout (SEB), and single-event gate rupture (SEGR) immune up to linear

文件：3.85939 Mbytes 页数：68 Pages

TI

德州仪器

丝印：7H1111PWP；Package：HTSSOP；TPS7H1111-SP and TPS7H1111-SEP 1.5-A, Ultra-Low Noise, High PSRR Radiation Hardened Low Dropout (LDO) Linear Regulator

1 Features • Total ionizing dose (TID) characterized – Radiation hardness assurance (RHA) availability of 100 krad(Si) or 50 krad(Si) • Single-Event Effects (SEE) characterized – Single-event latchup (SEL), single-event burnout (SEB), and single-event gate rupture (SEGR) immune up to linear

文件：3.75129 Mbytes 页数：66 Pages

TI

德州仪器

丝印：7H1111PWP；Package：HTSSOP；TPS7H1111-SP and TPS7H1111-SEP 1.5-A, Ultra-Low Noise, High PSRR Radiation Hardened Low Dropout (LDO) Linear Regulator

1 Features • Total ionizing dose (TID) characterized – Radiation hardness assurance (RHA) availability of 100 krad(Si) or 50 krad(Si) • Single-Event Effects (SEE) characterized – Single-event latchup (SEL), single-event burnout (SEB), and single-event gate rupture (SEGR) immune up to linear

文件：3.85939 Mbytes 页数：68 Pages

TI

德州仪器

丝印：7H1111PWP；Package：HTSSOP；TPS7H1111-SP and TPS7H1111-SEP 1.5-A, Ultra-Low Noise, High PSRR Radiation Hardened Low Dropout (LDO) Linear Regulator

1 Features • Total ionizing dose (TID) characterized – Radiation hardness assurance (RHA) availability of 100 krad(Si) or 50 krad(Si) • Single-Event Effects (SEE) characterized – Single-event latchup (SEL), single-event burnout (SEB), and single-event gate rupture (SEGR) immune up to linear

文件：3.75129 Mbytes 页数：66 Pages

TI

德州仪器

丝印：7H1111PWP；Package：HTSSOP；TPS7H1111-SP and TPS7H1111-SEP 1.5-A, Ultra-Low Noise, High PSRR Radiation Hardened Low Dropout (LDO) Linear Regulator

1 Features • Total ionizing dose (TID) characterized – Radiation hardness assurance (RHA) availability of 100 krad(Si) or 50 krad(Si) • Single-Event Effects (SEE) characterized – Single-event latchup (SEL), single-event burnout (SEB), and single-event gate rupture (SEGR) immune up to linear

文件：3.85939 Mbytes 页数：68 Pages

TI

德州仪器

丝印：7H1111PWP；Package：HTSSOP；TPS7H1111-SP and TPS7H1111-SEP 1.5-A, Ultra-Low Noise, High PSRR Radiation Hardened Low Dropout (LDO) Linear Regulator

1 Features • Total ionizing dose (TID) characterized – Radiation hardness assurance (RHA) availability of 100 krad(Si) or 50 krad(Si) • Single-Event Effects (SEE) characterized – Single-event latchup (SEL), single-event burnout (SEB), and single-event gate rupture (SEGR) immune up to linear

文件：3.75129 Mbytes 页数：66 Pages

TI

德州仪器