TPS7H1111MPWPTSEP芯片代码丝印对应型号-114ic电子网

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型号	下载订购	功能描述	制造商上传企业	LOGO
TPS7H1111MPWPTSEP	文件：3.85939 Mbytes Page：68 Pages	丝印：7H1111PWP；Package：HTSSOP；TPS7H1111-SP and TPS7H1111-SEP 1.5-A, Ultra-Low Noise, High PSRR Radiation Hardened Low Dropout (LDO) Linear Regulator 1 Features • Total ionizing dose (TID) characterized – Radiation hardness assurance (RHA) availability of 100 krad(Si) or 50 krad(Si) • Single-Event Effects (SEE) characterized – Single-event latchup (SEL), single-event burnout (SEB), and single-event gate rupture (SEGR) immune up to linear 文件：3.85939 Mbytes 页数：68 Pages	TI 德州仪器	TI
TPS7H1111MPWPTSEP	文件：3.75129 Mbytes Page：66 Pages	丝印：7H1111PWP；Package：HTSSOP；TPS7H1111-SP and TPS7H1111-SEP 1.5-A, Ultra-Low Noise, High PSRR Radiation Hardened Low Dropout (LDO) Linear Regulator 1 Features • Total ionizing dose (TID) characterized – Radiation hardness assurance (RHA) availability of 100 krad(Si) or 50 krad(Si) • Single-Event Effects (SEE) characterized – Single-event latchup (SEL), single-event burnout (SEB), and single-event gate rupture (SEGR) immune up to linear 文件：3.75129 Mbytes 页数：66 Pages	TI 德州仪器	TI
V62/23602-01XE	文件：3.85939 Mbytes Page：68 Pages	丝印：7H1111PWP；Package：HTSSOP；TPS7H1111-SP and TPS7H1111-SEP 1.5-A, Ultra-Low Noise, High PSRR Radiation Hardened Low Dropout (LDO) Linear Regulator 1 Features • Total ionizing dose (TID) characterized – Radiation hardness assurance (RHA) availability of 100 krad(Si) or 50 krad(Si) • Single-Event Effects (SEE) characterized – Single-event latchup (SEL), single-event burnout (SEB), and single-event gate rupture (SEGR) immune up to linear 文件：3.85939 Mbytes 页数：68 Pages	TI 德州仪器	TI
V62/23602-01XE	文件：3.75129 Mbytes Page：66 Pages	丝印：7H1111PWP；Package：HTSSOP；TPS7H1111-SP and TPS7H1111-SEP 1.5-A, Ultra-Low Noise, High PSRR Radiation Hardened Low Dropout (LDO) Linear Regulator 1 Features • Total ionizing dose (TID) characterized – Radiation hardness assurance (RHA) availability of 100 krad(Si) or 50 krad(Si) • Single-Event Effects (SEE) characterized – Single-event latchup (SEL), single-event burnout (SEB), and single-event gate rupture (SEGR) immune up to linear 文件：3.75129 Mbytes 页数：66 Pages	TI 德州仪器	TI
V62SLASH23602-01XE	文件：3.85939 Mbytes Page：68 Pages	丝印：7H1111PWP；Package：HTSSOP；TPS7H1111-SP and TPS7H1111-SEP 1.5-A, Ultra-Low Noise, High PSRR Radiation Hardened Low Dropout (LDO) Linear Regulator 1 Features • Total ionizing dose (TID) characterized – Radiation hardness assurance (RHA) availability of 100 krad(Si) or 50 krad(Si) • Single-Event Effects (SEE) characterized – Single-event latchup (SEL), single-event burnout (SEB), and single-event gate rupture (SEGR) immune up to linear 文件：3.85939 Mbytes 页数：68 Pages	TI 德州仪器	TI
V62SLASH23602-01XE	文件：3.75129 Mbytes Page：66 Pages	丝印：7H1111PWP；Package：HTSSOP；TPS7H1111-SP and TPS7H1111-SEP 1.5-A, Ultra-Low Noise, High PSRR Radiation Hardened Low Dropout (LDO) Linear Regulator 1 Features • Total ionizing dose (TID) characterized – Radiation hardness assurance (RHA) availability of 100 krad(Si) or 50 krad(Si) • Single-Event Effects (SEE) characterized – Single-event latchup (SEL), single-event burnout (SEB), and single-event gate rupture (SEGR) immune up to linear 文件：3.75129 Mbytes 页数：66 Pages	TI 德州仪器	TI

供应商	型号	品牌	批号	封装	库存	备注	价格
深圳市弘扬芯城科技有限公司	TPS7H1121EVM-CVAL	TI(德州仪器)	2024+	N/A	500000	诚信服务,绝对原装原盘	询价
深圳市铭威达电子科技有限公司	TPS7H1201				3000	原装现货	询价
深圳市恒科翔业电子有限公司	TPS7H1201-HT	TI德州仪器	22+		24000	原装正品现货,实单可谈,量大价优	询价
深圳市中亿伟业电子有限公司	TPS7H1201-HT	TI/德州	2018+	SOIC	32500	VSSOP	询价
兆亿微波(北京)科技有限公司	TPS7H1201-HT	N/A			99		询价
万三科技(深圳)有限公司	TPS7H1201HTEVM	TI	22+	NA	500000	万三科技,秉承原装,购芯无忧	询价
贸泽芯城（深圳）电子科技有限公司	TPS7H1201HTEVM	TI/德州仪器	23+		11200	原厂授权一级代理、全球订货优势渠道、可提供一站式BO	询价
深圳市恒创达实业有限公司	TPS7H1201SHKS	TI	16+	原厂封装	30	宇航IC只做原装假一罚十	询价
深圳市宇集芯电子有限公司	TPS7H1201SHKS	TI	24+	N/A	90000	原厂正规渠道现货、保证原装正品价格合理	询价
深圳市鹏和科技有限公司	TPS7H1201SHKS	TI	24+		30	全新原装	询价

更多7H1111PWP供应商更新时间2025-9-14 8:00:00

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