SN74LVTH16244A-EP中文资料具有 TTL 兼容型 CMOS 输入和三态输出的增强型产品 16 通道、2.7V 至 3.6V 缓冲器数据手册TI规格书

描述 Description

The SN74LVTH16244A is a 16-bit buffer and line driver designed for low-voltage (3.3 V) VCC operation, but with the capability to provide a TTL interface to a 5-V system environment. This device can be used as four 4-bit buffers, two 8-bit buffers, or one 16-bit buffer. This device provides true outputs and symmetrical active-low output-enable (OE) inputs. Active bus-hold circuitry holds unused or undriven inputs at a valid logic state. Use of pullup or pulldown resistors with the bus-hold circuitry is not recommended. When VCC is between 0 V and 1.5 V, the device is in the high-impedance state during power up or power down. However, to ensure the high-impedance state above 1.5 V, OE should be tied to VCC through a pullup resistor; the minimum value of the resistor is determined by the current-sinking capability of the driver.This device is fully specified for hot-insertion applications using Ioff and power-up 3-state. The Ioff circuitry disables the outputs, preventing damaging current backflow through the device when it is powered down. The power-up 3-state circuitry places the outputs in the high-impedance state during power up and power down, which prevents driver conflict.

特性 Features

• Controlled Baseline
• Extended Temperature Performance of up to -40°C to 85°C, -40°C to 125°C and -55°C to 125°C
• Enhanced Product-Change Notification
• Member of the Texas Instruments Widebus™ Family
• Supports Mixed-Mode Signal Operation (5-V Input and Output Voltages With 3.3-V VCC)
• Typical VOLP (Output Ground Bounce) CC = 3.3 V, TA = 25°C
• Bus Hold on Data Inputs Eliminates the Need for External Pullup/Pulldown Resistors
• ESD Protection Exceeds JESD 22
• 200-V Machine Model (A115-A)

Widebus is a trademark of Texas Instruments
Component qualification in accordance with JEDEC and industry standards to ensure reliable operation over an extended temperature range. This includes, but is not limited to, Highly Accelerated Stress Test (HAST) or biased 85/85, temperature cycle, autoclave or unbiased HAST, electromigration, bond intermetallic life, and mold compound life. Such qualification testing should not be viewed as justifying use of this component beyond specified performance and environmental limits.