丝印：SC245SEP；Package：TSSOP；SN54SC245-SEP Radiation-Tolerant, 1.2-V to 5.5-V, Octal Bus Transceivers With 3-State Outputs

1 Features • Vendor item drawing available, VID V62/23616 • Total ionizing dose characterized at 30 krad(Si) – Total ionizing dose characterized radiation lot acceptance testing (TID RLAT) for every wafer lot to 30 krad(Si) • Single-event effects (SEE) characterized: – Single event latch-up

文件：889.06 Kbytes 页数：25 Pages

TI

德州仪器

丝印：SC245SEP；Package：TSSOP；SN54SC245-SEP Radiation-Tolerant, 1.2-V to 5.5-V, Octal Bus Transceivers With 3-State Outputs

1 Features • Vendor item drawing available, VID V62/23616 • Total ionizing dose characterized at 30 krad(Si) – Total ionizing dose characterized radiation lot acceptance testing (TID RLAT) for every wafer lot to 30 krad(Si) • Single-event effects (SEE) characterized: – Single event latch-up

文件：924.77 Kbytes 页数：26 Pages

TI

德州仪器

丝印：SC245SEP；Package：TSSOP；SN54SC245-SEP Radiation-Tolerant, 1.2-V to 5.5-V, Octal Bus Transceivers With 3-State Outputs

1 Features • Vendor item drawing available, VID V62/23616 • Total ionizing dose characterized at 30 krad(Si) – Total ionizing dose characterized radiation lot acceptance testing (TID RLAT) for every wafer lot to 30 krad(Si) • Single-event effects (SEE) characterized: – Single event latch-up

文件：889.06 Kbytes 页数：25 Pages

TI

德州仪器

丝印：SC245SEP；Package：TSSOP；SN54SC245-SEP Radiation-Tolerant, 1.2-V to 5.5-V, Octal Bus Transceivers With 3-State Outputs

1 Features • Vendor item drawing available, VID V62/23616 • Total ionizing dose characterized at 30 krad(Si) – Total ionizing dose characterized radiation lot acceptance testing (TID RLAT) for every wafer lot to 30 krad(Si) • Single-event effects (SEE) characterized: – Single event latch-up

文件：924.77 Kbytes 页数：26 Pages

TI

德州仪器

丝印：SC245SEP；Package：TSSOP；SN54SC245-SEP Radiation-Tolerant, 1.2-V to 5.5-V, Octal Bus Transceivers With 3-State Outputs

1 Features • Vendor item drawing available, VID V62/23616 • Total ionizing dose characterized at 30 krad(Si) – Total ionizing dose characterized radiation lot acceptance testing (TID RLAT) for every wafer lot to 30 krad(Si) • Single-event effects (SEE) characterized: – Single event latch-up

文件：889.06 Kbytes 页数：25 Pages

TI

德州仪器

高灵敏度单极霍尔效应传感器

SC2455是采用BiCMOS技术生产的斩波稳定的霍尔效应传感器，提供具有高灵敏度、温度稳定性和综合保护功能的磁传感解决方案。内部集成的稳压电路使芯片可接受2.5V到24V的宽电源供电电压，满足工业和汽车电子的应用需求。 • AEC-Q100 \n• 斩波频率高\n• 工作电压范围： 2.5V~24V\n• EMC性能好\n• 所有引脚均具有过压保护;

Semiment

赛卓电子

10A Triac

This Triac is packaged in TO-48 package, which has a maximum on-state current RMS of 10A.\n\n Available as High Reliability device per MIL-PRF-19500 indicate –HR suffix after the part number. Contact for -HR flow. Add \"PBF\" suffix for Pb-free lead finish.

Digitron

10A Triac

This Triac is packaged in TO-48 ISO package, which has a maximum on-state current RMS of 10A.\n\n Available as High Reliability device per MIL-PRF-19500 indicate –HR suffix after the part number. Contact for -HR flow. Add \"PBF\" suffix for Pb-free lead finish.\n\n

Digitron

Package：28-SOIC（0.295"，7.50mm 宽）；包装：卷带（TR） 功能：降压 类别：集成电路（IC） PMIC - 稳压器 - DC DC 开关式控制器 描述：IC REG CTRLR BUCK 28SOIC

Semtech Corporation

Package：28-TSSOP（0.173"，4.40mm 宽）；包装：卷带（TR） 类别：集成电路（IC） 线性稳压器控制器 描述：IC REG QUAD BCK/LNR SYNC 28TSSOP

Semtech Corporation