V62/23616-01XE说明书PDF资料贸易商TI-114ic电子网

型号	下载订购	功能描述	制造商上传企业	LOGO
V62/23616-01XE	文件：924.77 Kbytes Page：26 Pages	丝印：SC245SEP；Package：TSSOP；SN54SC245-SEP Radiation-Tolerant, 1.2-V to 5.5-V, Octal Bus Transceivers With 3-State Outputs 1 Features • Vendor item drawing available, VID V62/23616 • Total ionizing dose characterized at 30 krad(Si) – Total ionizing dose characterized radiation lot acceptance testing (TID RLAT) for every wafer lot to 30 krad(Si) • Single-event effects (SEE) characterized: – Single event latch-up 文件：924.77 Kbytes 页数：26 Pages	TI 德州仪器	TI
V62/23616-01XE	文件：889.06 Kbytes Page：25 Pages	丝印：SC245SEP；Package：TSSOP；SN54SC245-SEP Radiation-Tolerant, 1.2-V to 5.5-V, Octal Bus Transceivers With 3-State Outputs 1 Features • Vendor item drawing available, VID V62/23616 • Total ionizing dose characterized at 30 krad(Si) – Total ionizing dose characterized radiation lot acceptance testing (TID RLAT) for every wafer lot to 30 krad(Si) • Single-event effects (SEE) characterized: – Single event latch-up 文件：889.06 Kbytes 页数：25 Pages	TI 德州仪器	TI
V6309MSP3B	文件：0 bytes Page：0 Pages	SOT-23	UEM 上传：深圳市宏誉半导体有限公司	UEM

更多V62/23616-01XE供应商更新时间2025-12-13 16:35:00