首页 >GS8161E18DD-333>规格书列表
型号 | 下载 订购 | 功能描述 | 制造商 上传企业 | LOGO |
---|---|---|---|---|
GS8161E18DD-333 | 18Mb SyncBurst SRAMs Features • FT pin for user-configurable flow through or pipeline operation • Dual Cycle Deselect (DCD) operation • IEEE 1149.1 JTAG-compatible Boundary Scan • 2.5 V or 3.3 V +10%/–10% core power supply • 2.5 V or 3.3 V I/O supply • LBO pin for Linear or Interleaved Burst mode • Inte 文件:1.22883 Mbytes 页数:37 Pages | GSI | GSI | |
GS8161E18DD-333 | 18Mb SyncBurst SRAMs Features • FT pin for user-configurable flow through or pipeline operation • Dual Cycle Deselect (DCD) operation • IEEE 1149.1 JTAG-compatible Boundary Scan • 2.5 V or 3.3 V +10%/–10% core power supply • 2.5 V or 3.3 V I/O supply • LBO pin for Linear or Interleaved Burst mode • Inte 文件:1.22882 Mbytes 页数:37 Pages | GSI | GSI | |
GS8161E18DD-333 | 18Mb SyncBurst SRAMs Features • FT pin for user-configurable flow through or pipeline operation • Dual Cycle Deselect (DCD) operation • IEEE 1149.1 JTAG-compatible Boundary Scan • 2.5 V or 3.3 V +10%/–10% core power supply • 2.5 V or 3.3 V I/O supply • LBO pin for Linear or Interleaved Burst mode • Inte 文件:1.22883 Mbytes 页数:37 Pages | GSI | GSI | |
GS8161E18DD-333 | 18Mb SyncBurst SRAMs Features • FT pin for user-configurable flow through or pipeline operation • Dual Cycle Deselect (DCD) operation • IEEE 1149.1 JTAG-compatible Boundary Scan • 2.5 V or 3.3 V +10%/–10% core power supply • 2.5 V or 3.3 V I/O supply • LBO pin for Linear or Interleaved Burst mode • Inte 文件:1.22883 Mbytes 页数:37 Pages | GSI | GSI | |
GS8161E18DD-333 | 18Mb SyncBurst SRAMs Features • FT pin for user-configurable flow through or pipeline operation • Dual Cycle Deselect (DCD) operation • IEEE 1149.1 JTAG-compatible Boundary Scan • 2.5 V or 3.3 V +10%/–10% core power supply • 2.5 V or 3.3 V I/O supply • LBO pin for Linear or Interleaved Burst mode • Inte 文件:1.22882 Mbytes 页数:37 Pages | GSI | GSI | |
GS8161E18DD-333 | 18Mb SyncBurst SRAMs Features • FT pin for user-configurable flow through or pipeline operation • Dual Cycle Deselect (DCD) operation • IEEE 1149.1 JTAG-compatible Boundary Scan • 2.5 V or 3.3 V +10%/–10% core power supply • 2.5 V or 3.3 V I/O supply • LBO pin for Linear or Interleaved Burst mode • Inte 文件:1.22883 Mbytes 页数:37 Pages | GSI | GSI | |
GS8161E18DD-333 | 18Mb SyncBurst SRAMs Features • FT pin for user-configurable flow through or pipeline operation • Dual Cycle Deselect (DCD) operation • IEEE 1149.1 JTAG-compatible Boundary Scan • 2.5 V or 3.3 V +10%/–10% core power supply • 2.5 V or 3.3 V I/O supply • LBO pin for Linear or Interleaved Burst mode • Inte 文件:1.22883 Mbytes 页数:37 Pages | GSI | GSI | |
GS8161E18DD-333 | 18Mb SyncBurst SRAMs Features • FT pin for user-configurable flow through or pipeline operation • Dual Cycle Deselect (DCD) operation • IEEE 1149.1 JTAG-compatible Boundary Scan • 2.5 V or 3.3 V +10%/–10% core power supply • 2.5 V or 3.3 V I/O supply • LBO pin for Linear or Interleaved Burst mode • Inte 文件:1.22882 Mbytes 页数:37 Pages | GSI | GSI | |
GS8161E18DD-333 | SYNCBURST SRAMs • Industry-standard Synchronous Burst Interface\n• ZQ mode pin for user-selectable high/low output drive\n• LBO pin for Linear or Interleaved Burst mode\n• Byte Write (BW) and/or Global Write (GW) operation\n• Internal self-timed write cycle\n• Automatic power-down for portable applications\n• JEDEC; | GSI | GSI | |
18Mb SyncBurst SRAMs Features • FT pin for user-configurable flow through or pipeline operation • Dual Cycle Deselect (DCD) operation • IEEE 1149.1 JTAG-compatible Boundary Scan • 2.5 V or 3.3 V +10%/–10% core power supply • 2.5 V or 3.3 V I/O supply • LBO pin for Linear or Interleaved Burst mode • Inte 文件:1.22883 Mbytes 页数:37 Pages | GSI | GSI |
技术参数
- Density:
18Mb
- Configuration:
x18
- Cycle Time (MHz):
333
- Access Time (ns):
4.5
- Voltage (V):
2.5
- Package:
165 BGA
- 6/6 RoHS:
no
- Temp:
Comm
- Special Features:
DCD
- Status:
Production
- MSL:
3
- ECCN:
3A991
- ECCN Suball:
B2B
- HTS Code:
8542.32.00.40
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