丝印：BCT8245A；Package：SOIC；SCAN TEST DEVICES WITH OCTAL BUS TRANSCEIVERS

Members of the Texas Instruments SCOPE ™ Family of Testability Products Octal Test-Integrated Circuits Functionally Equivalent to ’F245 and BCT245 in the Normal- Function Mode Compatible With the IEEE Standard 1149.1-1990 (JTAG) Test Access Port and Boundary-Scan Architecture Test Operatio

文件：503.26 Kbytes 页数：29 Pages

TI

德州仪器

丝印：BCT8245A；Package：SOIC；SCAN TEST DEVICES WITH OCTAL BUS TRANSCEIVERS

Members of the Texas Instruments SCOPE ™ Family of Testability Products Octal Test-Integrated Circuits Functionally Equivalent to ’F245 and BCT245 in the Normal- Function Mode Compatible With the IEEE Standard 1149.1-1990 (JTAG) Test Access Port and Boundary-Scan Architecture Test Operatio

文件：503.26 Kbytes 页数：29 Pages

TI

德州仪器

丝印：BCT8245A；Package：SOIC；SCAN TEST DEVICES WITH OCTAL BUS TRANSCEIVERS

Members of the Texas Instruments SCOPE ™ Family of Testability Products Octal Test-Integrated Circuits Functionally Equivalent to ’F245 and BCT245 in the Normal- Function Mode Compatible With the IEEE Standard 1149.1-1990 (JTAG) Test Access Port and Boundary-Scan Architecture Test Operatio

文件：503.26 Kbytes 页数：29 Pages

TI

德州仪器

丝印：BCT8245A；Package：SOIC；WITH OCTAL BUS TRANSCEIVERS

文件：1.01182 Mbytes 页数：29 Pages

TI

德州仪器

丝印：BCT8245A；Package：SOIC；WITH OCTAL BUS TRANSCEIVERS

文件：1.01182 Mbytes 页数：29 Pages

TI

德州仪器