丝印：AC11244；Package：SOIC；OCTAL BUFFER/DRIVER WITH 3-STATE OUTPUTS

EPICE (Enhanced-Performance Implanted CMOS ) 1-mm Process 3-State Outputs Drive Bus Lines or Buffer Memory Address Registers Flow-Through Architecture Optimizes PCB Layout Center-Pin VCC and GND Pin Configurations Minimize High-Speed Switching Noise 500-mA Typical Latch-Up Immunity at 12

文件：412.15 Kbytes 页数：15 Pages

TI

德州仪器

丝印：AC11244；Package：SOIC；OCTAL BUFFER/DRIVER WITH 3-STATE OUTPUTS

EPICE (Enhanced-Performance Implanted CMOS ) 1-mm Process 3-State Outputs Drive Bus Lines or Buffer Memory Address Registers Flow-Through Architecture Optimizes PCB Layout Center-Pin VCC and GND Pin Configurations Minimize High-Speed Switching Noise 500-mA Typical Latch-Up Immunity at 12

文件：412.15 Kbytes 页数：15 Pages

TI

德州仪器

丝印：AC11245；Package：SOIC；OCTAL BUS TRANSCEIVER WITH 3-STATE OUTPUTS

3-State Outputs Drive Bus Lines Directly Flow-Through Architecture Optimizes PCB Layout Center-Pin VCC and GND Configurations Minimize High-Speed Switching Noise EPIC (Enhanced-Performance Implanted CMOS) 1-
m Process 500-mA Typical Latch-Up Immunity at 125°C Package Options Include Plas

文件：629.36 Kbytes 页数：17 Pages

TI

德州仪器

丝印：AC11257；Package：SOIC；QUADRUPLE 2-LINE TO 1-LINE DATA SELECTOR/MULTIPLEXER WITH 3-STATE OUTPUTS

3-State Outputs Interface Directly With System Bus Flow-Through Architecture Optimizes PCB Layout Center-Pin VCC and GND Configurations Minimize High-Speed Switching Noise 500-mA Typical Latch-Up Immunity at 125°C Provides Bus Interface From Multiple Sources in High-Performance Systems

文件：723.01 Kbytes 页数：16 Pages

TI

德州仪器

丝印：AC112M；Package：SOIC；DUAL J-K NEGATIVE-EDGE-TRIGGERED FLIP-FLOPS WITH CLEAR AND PRESET

AC Types Feature 1.5-V to 5.5-V Operation and Balanced Noise Immunity at 30% of the Supply Voltage Speed of Bipolar F, AS, and S, With Significantly Reduced Power Consumption Balanced Propagation Delays ±24-mA Output Drive Current – Fanout to 15 F Devices SCR-Latchup-Resistant CMOS Pro

文件：426.59 Kbytes 页数：15 Pages

TI

德州仪器

丝印：AC112M；Package：SOIC；DUAL J-K NEGATIVE-EDGE-TRIGGERED FLIP-FLOPS WITH CLEAR AND PRESET

AC Types Feature 1.5-V to 5.5-V Operation and Balanced Noise Immunity at 30% of the Supply Voltage Speed of Bipolar F, AS, and S, With Significantly Reduced Power Consumption Balanced Propagation Delays ±24-mA Output Drive Current – Fanout to 15 F Devices SCR-Latchup-Resistant CMOS Pro

文件：426.59 Kbytes 页数：15 Pages

TI

德州仪器

丝印：AC112M；Package：SOIC；DUAL J-K NEGATIVE-EDGE-TRIGGERED FLIP-FLOPS WITH CLEAR AND PRESET

AC Types Feature 1.5-V to 5.5-V Operation and Balanced Noise Immunity at 30% of the Supply Voltage Speed of Bipolar F, AS, and S, With Significantly Reduced Power Consumption Balanced Propagation Delays ±24-mA Output Drive Current – Fanout to 15 F Devices SCR-Latchup-Resistant CMOS Pro

文件：426.59 Kbytes 页数：15 Pages

TI

德州仪器

丝印：AC11IQ1；Package：SOIC；SN74AC11-Q1 Automotive Triple 3-Input Positive-AND Gate

1 Features • AEC-Q100 qualified for automotive applications: – Device temperature grade 1: -40°C to +125°C – Device HBM ESD classification level 2 – Device CDM ESD classification level C4B • Wide operating range of 1.5V to 6V • Inputs accept voltages up to 6V • Continuous 24mA output drive

文件：1.69666 Mbytes 页数：26 Pages

TI

德州仪器

丝印：AC11IQ1；Package：TSSOP；SN74AC11-Q1 Automotive Triple 3-Input Positive-AND Gate

1 Features • AEC-Q100 qualified for automotive applications: – Device temperature grade 1: -40°C to +125°C – Device HBM ESD classification level 2 – Device CDM ESD classification level C4B • Wide operating range of 1.5V to 6V • Inputs accept voltages up to 6V • Continuous 24mA output drive

文件：1.69666 Mbytes 页数：26 Pages

TI

德州仪器

QUAD 2 INPUT NAND SCHMITT TRIGGER

恩XP