丝印：UCC21550BQ；Package：SOIC；UCC21550x-Q1 Automotive 4A, 6A, Reinforced Isolation Dual-Channel Gate Driver

1 Features • Universal: dual low-side, dual high-side or halfbridge driver • AEC-Q100 qualified with the following results – Device temperature grade 1 • Junction temperature range –40 to +150°C • Up to 4A peak source and 6A peak sink output • Common-mode transient immunity (CMTI) greater

文件：1.75246 Mbytes 页数：46 Pages

TI1

德州仪器

丝印：UCC21550BQ；Package：SOIC；UCC21550x-Q1 Automotive 4A, 6A, Reinforced Isolation Dual-Channel Gate Driver

1 Features • Universal: dual low-side, dual high-side or halfbridge driver • AEC-Q100 qualified with the following results – Device temperature grade 1 • Junction temperature range –40 to +150°C • Up to 4A peak source and 6A peak sink output • Common-mode transient immunity (CMTI) greater

文件：1.75246 Mbytes 页数：46 Pages

TI1

德州仪器

丝印：21550BQ；Package：SOIC；UCC21550x-Q1 Automotive 4A, 6A, Reinforced Isolation Dual-Channel Gate Driver

1 Features • Universal: dual low-side, dual high-side or halfbridge driver • AEC-Q100 qualified with the following results – Device temperature grade 1 • Junction temperature range –40 to +150°C • Up to 4A peak source and 6A peak sink output • Common-mode transient immunity (CMTI) greater

文件：1.75246 Mbytes 页数：46 Pages

TI1

德州仪器

UCC21550x-Q1 Automotive 4-A, 6-A, Reinforced Isolation Dual-Channel Gate Driver

1 Features • Universal: dual low-side, dual high-side or halfbridge driver • AEC-Q100 qualified with the following results – Device temperature grade 1 – Device HBM ESD classification level H2 – Device CDM ESD classification level C4B • Functional safety quality-managed – Documentation ava

文件：2.1706 Mbytes 页数：41 Pages

TI1

德州仪器