SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS

文件：474.07 Kbytes 页数：26 Pages

TI

德州仪器

SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS

文件：644.36 Kbytes 页数：28 Pages

TI

德州仪器

SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS

文件：474.07 Kbytes 页数：26 Pages

TI

德州仪器

SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS

文件：644.36 Kbytes 页数：28 Pages

TI

德州仪器

SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS

文件：644.36 Kbytes 页数：28 Pages

TI

德州仪器

SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS

文件：644.36 Kbytes 页数：28 Pages

TI

德州仪器

SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS

文件：474.07 Kbytes 页数：26 Pages

TI

德州仪器

SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS

文件：644.36 Kbytes 页数：28 Pages

TI

德州仪器

SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS

文件：474.07 Kbytes 页数：26 Pages

TI

德州仪器

具有八路边沿触发式 D 型触发器的扫描测试设备

The 'BCT8374A scan test devices with octal edge-triggered D-type flip-flops are members of the Texas Instruments SCOPETM testability integrated-circuit family. This family of devices supports IEEE Standard 1149.1-1990 boundary scan to facilitate testing of complex circuit-board assemblies. Scan acce • Members of the Texas Instruments SCOPETM Family of Testability Products \n• Functionally Equivalent to 'F374 and 'BCT374 in the Normal-Function Mode \n• Test Operation Synchronous to Test Access Port (TAP) \n• SCOPETM Instruction Set \n• Parallel-Signature Analysis at Inputs \n• Sample Inputs/Togg;

TI

德州仪器