丝印：SCAN92LV090VEH；Package：LQFP；SCAN92LV090 9 Channel Bus LVDS Transceiver w/ Boundary SCAN

1FEATURES 2• IEEE 1149.1 (JTAG) Compliant • Bus LVDS Signaling • Low Power CMOS Design • High Signaling Rate Capability (Above 100 Mbps) • 0.1V to 2.3V Common Mode Range for VID = 200mV • ±100 mV Receiver Sensitivity • Supports Open and Terminated Failsafe on Port Pins • 3.3V Operation

文件：853.04 Kbytes 页数：22 Pages

TI

德州仪器

丝印：SCAN92LV090VEH；Package：LQFP；SCAN92LV090 9 Channel Bus LVDS Transceiver w/ Boundary SCAN

1FEATURES 2• IEEE 1149.1 (JTAG) Compliant • Bus LVDS Signaling • Low Power CMOS Design • High Signaling Rate Capability (Above 100 Mbps) • 0.1V to 2.3V Common Mode Range for VID = 200mV • ±100 mV Receiver Sensitivity • Supports Open and Terminated Failsafe on Port Pins • 3.3V Operation

文件：853.04 Kbytes 页数：22 Pages

TI

德州仪器

Embedded Boundary Scan Controller (IEEE 1149.1 Support)

General Description The SCANPSC100F is designed to interface a generic parallel processor bus to a serial scan test bus. It is useful in improving scan throughput when applying serial vectors to system test circuitry and reduces the software overhead that is associated with applying serial patter

文件：208.11 Kbytes 页数：21 Pages

FAIRCHILD

仙童半导体

Embedded Boundary Scan Controller (IEEE 1149.1 Support)

General Description The SCANPSC100F is designed to interface a generic parallel processor bus to a serial scan test bus. It is useful in improving scan throughput when applying serial vectors to system test circuitry and reduces the software overhead that is associated with applying serial patter

文件：208.11 Kbytes 页数：21 Pages

FAIRCHILD

仙童半导体

SCAN Bridge Hierarchical and Multidrop Addressable JTAG Port (IEEE1149.1 System Test Support)

General Description The SCANPSC110F Bridge extends the IEEE Std. 1149.1 test bus into a multidrop test bus environment. The advantage of a hierarchical approach over a single serial scan chain is improved test throughput and the ability to remove a board from the system and retain test access to

文件：270.64 Kbytes 页数：25 Pages

FAIRCHILD

仙童半导体

SCAN Bridge Hierarchical and Multidrop Addressable JTAG Port (IEEE1149.1 System Test Support)

General Description The SCANPSC110F Bridge extends the IEEE Std. 1149.1 test bus into a multidrop test bus environment. The advantage of a hierarchical approach over a single serial scan chain is improved test throughput and the ability to remove a board from the system and retain test access to

文件：270.64 Kbytes 页数：25 Pages

FAIRCHILD

仙童半导体

SCANSTA101 Low Voltage IEEE 1149.1 System Test Access (STA) Master

1FEATURES 2• Compatible with IEEE Std. 1149.1 (JTAG) Test Access Port and Boundary Scan Architecture • Supported by Texas Instruments' SCAN Ease (SCAN Embedded Application Software Enabler) Software Rev 2.0 • Uses Generic, Asynchronous Processor Interface; Compatible with a Wide Range of P

文件：923 Kbytes 页数：42 Pages

TI

德州仪器

SCANSTA101 Low Voltage IEEE 1149.1 System Test Access (STA) Master

1FEATURES 2• Compatible with IEEE Std. 1149.1 (JTAG) Test Access Port and Boundary Scan Architecture • Supported by Texas Instruments' SCAN Ease (SCAN Embedded Application Software Enabler) Software Rev 2.0 • Uses Generic, Asynchronous Processor Interface; Compatible with a Wide Range of P

文件：923 Kbytes 页数：42 Pages

TI

德州仪器

丝印：SCANSTA101SM；Package：NFBGA；SCANSTA101 Low Voltage IEEE 1149.1 System Test Access (STA) Master

1FEATURES 2• Compatible with IEEE Std. 1149.1 (JTAG) Test Access Port and Boundary Scan Architecture • Supported by Texas Instruments' SCAN Ease (SCAN Embedded Application Software Enabler) Software Rev 2.0 • Uses Generic, Asynchronous Processor Interface; Compatible with a Wide Range of P

文件：923 Kbytes 页数：42 Pages

TI

德州仪器

丝印：SCANSTA101SM；Package：NFBGA；SCANSTA101 Low Voltage IEEE 1149.1 System Test Access (STA) Master

1FEATURES 2• Compatible with IEEE Std. 1149.1 (JTAG) Test Access Port and Boundary Scan Architecture • Supported by Texas Instruments' SCAN Ease (SCAN Embedded Application Software Enabler) Software Rev 2.0 • Uses Generic, Asynchronous Processor Interface; Compatible with a Wide Range of P

文件：923 Kbytes 页数：42 Pages

TI

德州仪器