SCAN Bridge Hierarchical and Multidrop Addressable JTAG Port (IEEE1149.1 System Test Support)

General Description The SCANPSC110F Bridge extends the IEEE Std. 1149.1 test bus into a multidrop test bus environment. The advantage of a hierarchical approach over a single serial scan chain is improved test throughput and the ability to remove a board from the system and retain test access to

文件：270.64 Kbytes 页数：25 Pages

Fairchild

仙童半导体

SCAN Bridge Hierarchical and Multidrop Addressable JTAG Port (IEEE1149.1 System Test Support)

文件：459.9 Kbytes 页数：29 Pages

NSC

国半

SCAN Bridge Hierarchical and Multidrop Addressable JTAG Port (IEEE1149.1 System Test Support)

General Description The SCANPSC110F Bridge extends the IEEE Std. 1149.1 test bus into a multidrop test bus environment. The advantage of a hierarchical approach over a single serial scan chain is improved test throughput and the ability to remove a board from the system and retain test access to

文件：270.64 Kbytes 页数：25 Pages

Fairchild

仙童半导体

SCAN Bridge Hierarchical and Multidrop Addressable JTAG Port (IEEE1149.1 System Test Support)

文件：459.9 Kbytes 页数：29 Pages

NSC

国半

SCAN Bridge Hierarchical and Multidrop Addressable JTAG Port (IEEE1149.1 System Test Support)

文件：459.9 Kbytes 页数：29 Pages

NSC

国半

SCAN Bridge Hierarchical and Multidrop Addressable JTAG Port (IEEE1149.1 System Test Support)

文件：459.9 Kbytes 页数：29 Pages

NSC

国半

SCAN Bridge Hierarchical and Multidrop Addressable JTAG Port (IEEE1149.1 System Test Support)

ONSEMI

安森美半导体

Package：28-QFN；包装：管件 类别：集成电路（IC） 专用 描述：IC INTERFACE SPECIALIZED 28CLCC

TI

德州仪器

Package：28-SOIC（0.295"，7.50mm 宽）；包装：卷带（TR）剪切带（CT） 类别：集成电路（IC） 专用 描述：IC INTERFACE SPECIALIZED 28SOIC

ONSEMI

安森美半导体

Package：28-SOIC（0.295"，7.50mm 宽）；包装：管件 类别：集成电路（IC） 专用 描述：IC INTERFACE SPECIALIZED 28SOIC

ONSEMI

安森美半导体