SCAN921260 X6 1:10 Deserializer with IEEE 1149.1 (JTAG) and at-speed BIST

1FEATURES 2• IEEE 1149.1 (JTAG) Compliant and At-Speed BIST Test Modes • Deserializes One to Six BusLVDS Input Serial Data Streams With Embedded Clocks • Seven Selectable Serial Inputs to Support N+1 Redundancy of Deserialized Streams • Seventh Channel Has Single Pin Monitor Output That Re

文件：807.86 Kbytes 页数：22 Pages

TI

德州仪器

SCAN921260 X6 1:10 Deserializer with IEEE 1149.1 (JTAG) and at-speed BIST

文件：739.79 Kbytes 页数：22 Pages

TI

德州仪器

X6 1:10 Deserializer with IEEE 1149.1 (JTAG) and at-speed BIST

文件：379.52 Kbytes 页数：16 Pages

NSCNational Semiconductor (TI)

美国国家半导体美国国家半导体公司

丝印：SCAN921260UJB；Package：NFBGA；SCAN921260 X6 1:10 Deserializer with IEEE 1149.1 (JTAG) and at-speed BIST

1FEATURES 2• IEEE 1149.1 (JTAG) Compliant and At-Speed BIST Test Modes • Deserializes One to Six BusLVDS Input Serial Data Streams With Embedded Clocks • Seven Selectable Serial Inputs to Support N+1 Redundancy of Deserialized Streams • Seventh Channel Has Single Pin Monitor Output That Re

文件：807.86 Kbytes 页数：22 Pages

TI

德州仪器

丝印：SCAN921260UJB；Package：NFBGA；SCAN921260 X6 1:10 Deserializer with IEEE 1149.1 (JTAG) and at-speed BIST

1FEATURES 2• IEEE 1149.1 (JTAG) Compliant and At-Speed BIST Test Modes • Deserializes One to Six BusLVDS Input Serial Data Streams With Embedded Clocks • Seven Selectable Serial Inputs to Support N+1 Redundancy of Deserialized Streams • Seventh Channel Has Single Pin Monitor Output That Re

文件：807.86 Kbytes 页数：22 Pages

TI

德州仪器

丝印：SCAN921260UJB；Package：NFBGA；SCAN921260 X6 1:10 Deserializer with IEEE 1149.1 (JTAG) and at-speed BIST

1FEATURES 2• IEEE 1149.1 (JTAG) Compliant and At-Speed BIST Test Modes • Deserializes One to Six BusLVDS Input Serial Data Streams With Embedded Clocks • Seven Selectable Serial Inputs to Support N+1 Redundancy of Deserialized Streams • Seventh Channel Has Single Pin Monitor Output That Re

文件：807.86 Kbytes 页数：22 Pages

TI

德州仪器

丝印：SCAN921260UJB；Package：NFBGA；SCAN921260 X6 1:10 Deserializer with IEEE 1149.1 (JTAG) and at-speed BIST

1FEATURES 2• IEEE 1149.1 (JTAG) Compliant and At-Speed BIST Test Modes • Deserializes One to Six BusLVDS Input Serial Data Streams With Embedded Clocks • Seven Selectable Serial Inputs to Support N+1 Redundancy of Deserialized Streams • Seventh Channel Has Single Pin Monitor Output That Re

文件：807.86 Kbytes 页数：22 Pages

TI

德州仪器

具有 IEEE 1149.1 和全速度 BIST 的六个 1 至 10 解串器

The SCAN921260 integrates six deserializer devices into a single chip. The SCAN921260 can simultaneously deserialize up to six data streams that have been serialized by the Texas Instruments SCAN921023 Bus LVDS serializer. The device also includes a seventh serial input channel that serves as a redu • IEEE 1149.1 (JTAG) Compliant and At-Speed BIST Test Modes\n• Deserializes One to Six BusLVDS Input Serial Data Streams With Embedded Clocks\n• Seven Selectable Serial Inputs to Support N+1 Redundancy of Deserialized Streams\n• Seventh Channel Has Single Pin Monitor Output That Reflects Input From ;

TI

德州仪器

X6 1:10 Deserializer with IEEE 1149.1 (JTAG) and at-speed BIST

文件：379.52 Kbytes 页数：16 Pages

NSCNational Semiconductor (TI)

美国国家半导体美国国家半导体公司

SCAN921260 X6 1:10 Deserializer with IEEE 1149.1 (JTAG) and at-speed BIST

文件：739.79 Kbytes 页数：22 Pages

TI

德州仪器