SCAN921025 and SCAN921226 30-80 MHz 10 Bit Bus LVDS Serializer and Deserializer with IEEE 1149.1 (JTAG) and at-speed BIST

1FEATURES 2• IEEE 1149.1 (JTAG) Compliant and At-Speed BIST Test Mode. • Clock Recovery From PLL Lock to Random Data Patterns. • Specified Transition Every Data Transfer Cycle • Chipset (Tx + Rx) Power Consumption

文件：1.06904 Mbytes 页数：30 Pages

TI

德州仪器

30-80 MHz 10 Bit Bus LVDS Serializer and Deserializer with IEEE 1149.1 (JTAG) and at-speed BIST

文件：474.73 Kbytes 页数：21 Pages

NSCNational Semiconductor (TI)

美国国家半导体美国国家半导体公司

SCAN921025 and SCAN921226 30-80 MHz 10 Bit Bus LVDS Serializer and Deserializer with IEEE 1149.1 (JTAG) and at-speed BIST

文件：906.75 Kbytes 页数：27 Pages

TI

德州仪器

丝印：SCAN921226SLC；Package：NFBGA；SCAN921025 and SCAN921226 30-80 MHz 10 Bit Bus LVDS Serializer and Deserializer with IEEE 1149.1 (JTAG) and at-speed BIST

1FEATURES 2• IEEE 1149.1 (JTAG) Compliant and At-Speed BIST Test Mode. • Clock Recovery From PLL Lock to Random Data Patterns. • Specified Transition Every Data Transfer Cycle • Chipset (Tx + Rx) Power Consumption

文件：1.06904 Mbytes 页数：30 Pages

TI

德州仪器

丝印：SCAN921226SLC；Package：NFBGA；SCAN921025 and SCAN921226 30-80 MHz 10 Bit Bus LVDS Serializer and Deserializer with IEEE 1149.1 (JTAG) and at-speed BIST

1FEATURES 2• IEEE 1149.1 (JTAG) Compliant and At-Speed BIST Test Mode. • Clock Recovery From PLL Lock to Random Data Patterns. • Specified Transition Every Data Transfer Cycle • Chipset (Tx + Rx) Power Consumption

文件：1.06904 Mbytes 页数：30 Pages

TI

德州仪器

丝印：SCAN921226SLC；Package：NFBGA；SCAN921025 and SCAN921226 30-80 MHz 10 Bit Bus LVDS Serializer and Deserializer with IEEE 1149.1 (JTAG) and at-speed BIST

1FEATURES 2• IEEE 1149.1 (JTAG) Compliant and At-Speed BIST Test Mode. • Clock Recovery From PLL Lock to Random Data Patterns. • Specified Transition Every Data Transfer Cycle • Chipset (Tx + Rx) Power Consumption

文件：1.06904 Mbytes 页数：30 Pages

TI

德州仪器

丝印：SCAN921226SLC；Package：NFBGA；SCAN921025 and SCAN921226 30-80 MHz 10 Bit Bus LVDS Serializer and Deserializer with IEEE 1149.1 (JTAG) and at-speed BIST

1FEATURES 2• IEEE 1149.1 (JTAG) Compliant and At-Speed BIST Test Mode. • Clock Recovery From PLL Lock to Random Data Patterns. • Specified Transition Every Data Transfer Cycle • Chipset (Tx + Rx) Power Consumption

文件：1.06904 Mbytes 页数：30 Pages

TI

德州仪器

High Temperature 20-80 MHz 10 Bit Bus LVDS SerDes with IEEE 1149.1 (JTAG) and at-speed BIST

文件：527.93 Kbytes 页数：21 Pages

NSCNational Semiconductor (TI)

美国国家半导体美国国家半导体公司

High Temperature 20-80 MHz 10 Bit Bus LVDS SerDes with IEEE 1149.1 (JTAG) and at-speed BIST

文件：903.37 Kbytes 页数：21 Pages

NSCNational Semiconductor (TI)

美国国家半导体美国国家半导体公司

SCAN921025H and SCAN921226H High Temperature 20-80 MHz 10 Bit Bus LVDS SerDes with IEEE 1149.1 (JTAG) and at-speed BIST

文件：1.45073 Mbytes 页数：29 Pages

TI

德州仪器