丝印：SAC32MEP；Package：SOIC；QUADRUPLE 2-INPUT POSITIVE-OR GATE

Controlled Baseline − One Assembly/Test Site, One Fabrication Site Extended Temperature Performance of −55°C to 125°C Enhanced Diminishing Manufacturing Sources (DMS) Support Enhanced Product-Change Notification Qualification Pedigree† 2-V to 6-V VCC Operation Inputs Accept Voltages to 6

文件：703.91 Kbytes 页数：9 Pages

TI

德州仪器

丝印：SAC32MEP；Package：SOIC；QUADRUPLE 2-INPUT POSITIVE-OR GATE

Controlled Baseline − One Assembly/Test Site, One Fabrication Site Extended Temperature Performance of −55°C to 125°C Enhanced Diminishing Manufacturing Sources (DMS) Support Enhanced Product-Change Notification Qualification Pedigree† 2-V to 6-V VCC Operation Inputs Accept Voltages to 6

文件：703.91 Kbytes 页数：9 Pages

TI

德州仪器

丝印：SAC32MEP；Package：SOIC；QUADRUPLE 2-INPUT POSITIVE-OR GATE

Controlled Baseline − One Assembly/Test Site, One Fabrication Site Extended Temperature Performance of −55°C to 125°C Enhanced Diminishing Manufacturing Sources (DMS) Support Enhanced Product-Change Notification Qualification Pedigree† 2-V to 6-V VCC Operation Inputs Accept Voltages to 6

文件：703.91 Kbytes 页数：9 Pages

TI

德州仪器

丝印：SAC32MEP；Package：SOIC；QUADRUPLE 2-INPUT POSITIVE-OR GATE

Controlled Baseline − One Assembly/Test Site, One Fabrication Site Extended Temperature Performance of −55°C to 125°C Enhanced Diminishing Manufacturing Sources (DMS) Support Enhanced Product-Change Notification Qualification Pedigree† 2-V to 6-V VCC Operation Inputs Accept Voltages to 6

文件：703.91 Kbytes 页数：9 Pages

TI

德州仪器