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SN74AC74MDREP

Marking:SAC74MEP;Package:SOIC;DUAL POSITIVE-EDGE-TRIGGERED D-TYPE FLIP-FLOP WITH CLEAR AND PRESET

ControlledBaseline −OneAssembly/TestSite,OneFabrication Site ExtendedTemperaturePerformanceof −55°Cto125°C EnhancedDiminishingManufacturing Sources(DMS)Support EnhancedProduct-ChangeNotification QualificationPedigree† 2-Vto6-VVCCOperation InputsAcceptVoltagesto6

TI2Texas Instruments

德州仪器美国德州仪器公司

SN74AC74MDREP.A

Marking:SAC74MEP;Package:SOIC;DUAL POSITIVE-EDGE-TRIGGERED D-TYPE FLIP-FLOP WITH CLEAR AND PRESET

ControlledBaseline −OneAssembly/TestSite,OneFabrication Site ExtendedTemperaturePerformanceof −55°Cto125°C EnhancedDiminishingManufacturing Sources(DMS)Support EnhancedProduct-ChangeNotification QualificationPedigree† 2-Vto6-VVCCOperation InputsAcceptVoltagesto6

TI2Texas Instruments

德州仪器美国德州仪器公司

V62/04617-01XE

Marking:SAC74MEP;Package:SOIC;DUAL POSITIVE-EDGE-TRIGGERED D-TYPE FLIP-FLOP WITH CLEAR AND PRESET

ControlledBaseline −OneAssembly/TestSite,OneFabrication Site ExtendedTemperaturePerformanceof −55°Cto125°C EnhancedDiminishingManufacturing Sources(DMS)Support EnhancedProduct-ChangeNotification QualificationPedigree† 2-Vto6-VVCCOperation InputsAcceptVoltagesto6

TI2Texas Instruments

德州仪器美国德州仪器公司

V62SLASH04617-01XE

Marking:SAC74MEP;Package:SOIC;DUAL POSITIVE-EDGE-TRIGGERED D-TYPE FLIP-FLOP WITH CLEAR AND PRESET

ControlledBaseline −OneAssembly/TestSite,OneFabrication Site ExtendedTemperaturePerformanceof −55°Cto125°C EnhancedDiminishingManufacturing Sources(DMS)Support EnhancedProduct-ChangeNotification QualificationPedigree† 2-Vto6-VVCCOperation InputsAcceptVoltagesto6

TI2Texas Instruments

德州仪器美国德州仪器公司

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