丝印：SACT74MEP；Package：SOIC；DUAL POSITIVE-EDGE-TRIGGERED D-TYPE FLIP-FLOP WITH CLEAR AND PRESET

Controlled Baseline − One Assembly/Test Site, One Fabrication Site Extended Temperature Performance of −55°C to 125°C Enhanced Diminishing Manufacturing Sources (DMS) Support Enhanced Product-Change Notification Qualification Pedigree† 4.5-V to 5.5-V VCC Operation Inputs Accept Voltages

文件：714.6 Kbytes 页数：10 Pages

TI

德州仪器

丝印：SACT74MEP；Package：SOIC；DUAL POSITIVE-EDGE-TRIGGERED D-TYPE FLIP-FLOP WITH CLEAR AND PRESET

Controlled Baseline − One Assembly/Test Site, One Fabrication Site Extended Temperature Performance of −55°C to 125°C Enhanced Diminishing Manufacturing Sources (DMS) Support Enhanced Product-Change Notification Qualification Pedigree† 4.5-V to 5.5-V VCC Operation Inputs Accept Voltages

文件：714.6 Kbytes 页数：10 Pages

TI

德州仪器

丝印：SACT74MEP；Package：SOIC；DUAL POSITIVE-EDGE-TRIGGERED D-TYPE FLIP-FLOP WITH CLEAR AND PRESET

Controlled Baseline − One Assembly/Test Site, One Fabrication Site Extended Temperature Performance of −55°C to 125°C Enhanced Diminishing Manufacturing Sources (DMS) Support Enhanced Product-Change Notification Qualification Pedigree† 4.5-V to 5.5-V VCC Operation Inputs Accept Voltages

文件：714.6 Kbytes 页数：10 Pages

TI

德州仪器