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SM4391NSKPC-TRG

发布企业:深圳市正纳电子有限公司 时间:2019-4-17 16:32:23
摘要: SM4391NSKPC-TRG主营现货,电脑PC端口现货

1、SM4391NSKPC product basic information

2、Reliability test item

3、Reliability test purpose

4、Reliability test result

5、Conclusion

6、Test data

1. Product basic information

Product Name:N-Channel Enhancement Mode MOSFET

Part No:SM4391NSKPC

Package Type :DFN5X6-8

2. Reliability test item

■ Precondition for SMD

■ Power cycling test (HPCT)

■ Temperature cycling test (TCT)

■ Pressure cooking test (PCT)

■ Temperature Humidity Test(THT)

■ Solder-ability

■ High temperature storage test (HTST)

■ High Temperature Gate Bias (HTGB)

■ High Temperature Reverse Bias (HTRB)

■ Electrostatic discharge test (ESD)

3. Reliability test purpose

■ New product evaluation

□ New process / material evaluation

□ Reliability monitor test

□ Other

4. Test result

No. Test Item Product Name /

Package Type Duration S.S Failed

# Conclusion

1 HPCT SM4391NSKPC 10000 cycles 45 0 PASS

2 TCT DFN5X6-8 500 cycles 77 0 PASS

3 PCT DFN5X6-8 168 hrs 77 0 PASS

4 THT DFN5X6-8 500 hrs 80 0 PASS

5 Solder-ability DFN5X6-8 5±0.5 sec 5 0 PASS

6 HTST DFN5X6-8 500 hrs 77 0 PASS

7 HTGB SM4391NSKPC 1000 hrs 45 0 PASS

8 HTRB SM4391NSKPC 1000 hrs 45 0 PASS

9 ESD SM4391NSKPC 0.5 sec 12 0 PASS

6-4 Pressure cooking test (PCT)

a. Test equipment: HIRAYAMA PC-242III

b. Standard: JESD22-A102-C

c. Test condition: 121 , 1 ℃ 00%RH, 2 ATM, 168hrs

d. Test result: All electrical test result after 0,168 hours were pass the spec.

6-5 Temp/Humidity Storage Test(THT)

a. Test equipment: KSON THS-G

b. Standard:JESD22-A101

c. Test condition:85±2℃/ 85±3%_RH, 500 hours

d. Test result: All electrical test result after 0, 168, 500 hours were pass the spec.

6-6 Solder-ability

a. Test equipment:WJ40RB

b. Standard: JESD22-B102D

c. Test condition:

C.1 Steam Ageing:93±3℃/ 6hrs±15min

C.2 Sn :Ag:Cu=96.5:3.0:0.5 / 245±5℃ / 5±0.5s

d. Test result: All Soldering area of up to 95%_were pass the spec.

6-7 High Temperature storage test (HTST)

a. Test equipment: TABAI PH-201

b. Standard: Per JESD22-A103C

c. Test condition: 150℃

d. Test result:

All electrical test result after 0, 168, 500 hours were pass. the spec.

6-8 High Temperature Gate Bias (HTGB)

a. Test equipment: YU-LONG DN-C Oven

b. Standard: JESD22-A108C

c. Test condition: Gate Bias= 20 V, 150℃, 1000hrs

d. Data summary:

联系方式

企业:深圳市正纳电子有限公司 查看联系方式 留言

联系人:邓小姐采购原装正品认准正纳电子

手机:13590264508

电话:0755-83790645(24小时)

传真:0755-83200684