DUAL 2-INPUT NAND BUFFER/DRIVER

DESCRIPTION The HCC40107B(extended temperature range) and HCF40107B(intermediate temperature range) are monolithic integrated circuits, available in 14-lead dual in-line ceramic package 8-lead minidip plastic package and 8-lead plastic micropackage. TheHCC/HCF40107Bis a dual 2-input NAND buf

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STMICROELECTRONICS

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RadHardened high voltage complementary MOS logic series

文件：141.35 Kbytes 页数：13 Pages

STMICROELECTRONICS

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DUAL 2-INPUT NAND BUFFER/DRIVER

DESCRIPTION The HCC40107B(extended temperature range) and HCF40107B(intermediate temperature range) are monolithic integrated circuits, available in 14-lead dual in-line ceramic package 8-lead minidip plastic package and 8-lead plastic micropackage. TheHCC/HCF40107Bis a dual 2-input NAND buf

文件：270.08 Kbytes 页数：14 Pages

STMICROELECTRONICS

意法半导体

Rad-hard high voltage CMOS logic series

文件：303.47 Kbytes 页数：24 Pages

STMICROELECTRONICS

意法半导体

Rad-hard high voltage CMOS logic series

文件：303.47 Kbytes 页数：24 Pages

STMICROELECTRONICS

意法半导体

Rad-hard dual 2-input NAND buffer/driver

The HCC40xxx and HCC45xxx series are composed of 70 types of high voltage CMOS functions,offering a set of highly noise tolerant gates, Flip-Flops, multiplexers, counters, businterfaces, and several other functions. The radiation hardness, single event latch-up (SEL),single event upset (SEU) immunit • 3 to 20 V max operating voltage\n• Buffered inputs and outputs\n• Standardized symmetrical outputs characteristic\n• 50 ns typical propagation delays\n• 100 nA max 25 °C input current\n• 100 % tested 20 V quiescent current• 5-10-15 V parametric testing\n• Hermetic packages\n• Rad-hard 100 kRad;

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