DAC1282 Low Distortion Digital-to-Analog Converter for Seismic

1 Features 1• Single-Chip Test Signal Generator • Buffered Voltage Output • High Performance: – THD: –125 dB (G = 1/1 to 1/8) – SNR: 120 dB (413 Hz BW, G = 1/1) • Analog and Digital Gain Control • Output Frequency: 0.488 Hz to 250 Hz • Sine, Pulse, and DC Modes • Digital Data Input Mode

文件：1.05462 Mbytes 页数：48 Pages

TI

德州仪器

LOW DISTORTION DIGITAL-TO-ANALOG CONVERTER FOR SEISMIC

文件：1.16983 Mbytes 页数：43 Pages

TI

德州仪器

丝印：DAC1282；Package：TSSOP；DAC1282 Low Distortion Digital-to-Analog Converter for Seismic

1 Features 1• Single-Chip Test Signal Generator • Buffered Voltage Output • High Performance: – THD: –125 dB (G = 1/1 to 1/8) – SNR: 120 dB (413 Hz BW, G = 1/1) • Analog and Digital Gain Control • Output Frequency: 0.488 Hz to 250 Hz • Sine, Pulse, and DC Modes • Digital Data Input Mode

文件：1.05462 Mbytes 页数：48 Pages

TI

德州仪器

丝印：DAC1282；Package：TSSOP；DAC1282 Low Distortion Digital-to-Analog Converter for Seismic

1 Features 1• Single-Chip Test Signal Generator • Buffered Voltage Output • High Performance: – THD: –125 dB (G = 1/1 to 1/8) – SNR: 120 dB (413 Hz BW, G = 1/1) • Analog and Digital Gain Control • Output Frequency: 0.488 Hz to 250 Hz • Sine, Pulse, and DC Modes • Digital Data Input Mode

文件：1.05462 Mbytes 页数：48 Pages

TI

德州仪器

丝印：DAC1282；Package：TSSOP；DAC1282 Low Distortion Digital-to-Analog Converter for Seismic

1 Features 1• Single-Chip Test Signal Generator • Buffered Voltage Output • High Performance: – THD: –125 dB (G = 1/1 to 1/8) – SNR: 120 dB (413 Hz BW, G = 1/1) • Analog and Digital Gain Control • Output Frequency: 0.488 Hz to 250 Hz • Sine, Pulse, and DC Modes • Digital Data Input Mode

文件：1.05462 Mbytes 页数：48 Pages

TI

德州仪器

丝印：DAC1282；Package：TSSOP；DAC1282 Low Distortion Digital-to-Analog Converter for Seismic

1 Features 1• Single-Chip Test Signal Generator • Buffered Voltage Output • High Performance: – THD: –125 dB (G = 1/1 to 1/8) – SNR: 120 dB (413 Hz BW, G = 1/1) • Analog and Digital Gain Control • Output Frequency: 0.488 Hz to 250 Hz • Sine, Pulse, and DC Modes • Digital Data Input Mode

文件：1.05462 Mbytes 页数：48 Pages

TI

德州仪器

丝印：DAC1282A；Package：TSSOP；DAC1282 Low Distortion Digital-to-Analog Converter for Seismic

1 Features 1• Single-Chip Test Signal Generator • Buffered Voltage Output • High Performance: – THD: –125 dB (G = 1/1 to 1/8) – SNR: 120 dB (413 Hz BW, G = 1/1) • Analog and Digital Gain Control • Output Frequency: 0.488 Hz to 250 Hz • Sine, Pulse, and DC Modes • Digital Data Input Mode

文件：1.05462 Mbytes 页数：48 Pages

TI

德州仪器

丝印：DAC1282A；Package：TSSOP；DAC1282 Low Distortion Digital-to-Analog Converter for Seismic

1 Features 1• Single-Chip Test Signal Generator • Buffered Voltage Output • High Performance: – THD: –125 dB (G = 1/1 to 1/8) – SNR: 120 dB (413 Hz BW, G = 1/1) • Analog and Digital Gain Control • Output Frequency: 0.488 Hz to 250 Hz • Sine, Pulse, and DC Modes • Digital Data Input Mode

文件：1.05462 Mbytes 页数：48 Pages

TI

德州仪器

丝印：DAC1282A；Package：TSSOP；DAC1282 Low Distortion Digital-to-Analog Converter for Seismic

1 Features 1• Single-Chip Test Signal Generator • Buffered Voltage Output • High Performance: – THD: –125 dB (G = 1/1 to 1/8) – SNR: 120 dB (413 Hz BW, G = 1/1) • Analog and Digital Gain Control • Output Frequency: 0.488 Hz to 250 Hz • Sine, Pulse, and DC Modes • Digital Data Input Mode

文件：1.05462 Mbytes 页数：48 Pages

TI

德州仪器

丝印：DAC1282A；Package：TSSOP；DAC1282 Low Distortion Digital-to-Analog Converter for Seismic

1 Features 1• Single-Chip Test Signal Generator • Buffered Voltage Output • High Performance: – THD: –125 dB (G = 1/1 to 1/8) – SNR: 120 dB (413 Hz BW, G = 1/1) • Analog and Digital Gain Control • Output Frequency: 0.488 Hz to 250 Hz • Sine, Pulse, and DC Modes • Digital Data Input Mode

文件：1.05462 Mbytes 页数：48 Pages

TI

德州仪器