丝印：DAC1280；Package：TSSOP；Low Distortion Digital-to-Analog Converter for Seismic Monitoring

1FEATURES 2• Outstanding Performance: – THD: –125dB – SNR: 120dB (413Hz BW, Gain = 1/1) – Gain Error: 0.1% • Pin Operation: No Registers to Program • Gain: 1/1 to 1/64 • SYNC Input for Phase Control • Power-Down Mode • Low Power: 18mW • Analog Supply: +5V or ±2.5V • Digital Supply:

文件：609.6 Kbytes 页数：26 Pages

TI

德州仪器

丝印：DAC1282A；Package：TSSOP；DAC1282 Low Distortion Digital-to-Analog Converter for Seismic

1 Features 1• Single-Chip Test Signal Generator • Buffered Voltage Output • High Performance: – THD: –125 dB (G = 1/1 to 1/8) – SNR: 120 dB (413 Hz BW, G = 1/1) • Analog and Digital Gain Control • Output Frequency: 0.488 Hz to 250 Hz • Sine, Pulse, and DC Modes • Digital Data Input Mode

文件：1.05462 Mbytes 页数：48 Pages

TI

德州仪器

丝印：DAC1282A；Package：TSSOP；DAC1282 Low Distortion Digital-to-Analog Converter for Seismic

1 Features 1• Single-Chip Test Signal Generator • Buffered Voltage Output • High Performance: – THD: –125 dB (G = 1/1 to 1/8) – SNR: 120 dB (413 Hz BW, G = 1/1) • Analog and Digital Gain Control • Output Frequency: 0.488 Hz to 250 Hz • Sine, Pulse, and DC Modes • Digital Data Input Mode

文件：1.05462 Mbytes 页数：48 Pages

TI

德州仪器

丝印：DAC1282A；Package：TSSOP；DAC1282 Low Distortion Digital-to-Analog Converter for Seismic

1 Features 1• Single-Chip Test Signal Generator • Buffered Voltage Output • High Performance: – THD: –125 dB (G = 1/1 to 1/8) – SNR: 120 dB (413 Hz BW, G = 1/1) • Analog and Digital Gain Control • Output Frequency: 0.488 Hz to 250 Hz • Sine, Pulse, and DC Modes • Digital Data Input Mode

文件：1.05462 Mbytes 页数：48 Pages

TI

德州仪器

丝印：DAC1282A；Package：TSSOP；DAC1282 Low Distortion Digital-to-Analog Converter for Seismic

1 Features 1• Single-Chip Test Signal Generator • Buffered Voltage Output • High Performance: – THD: –125 dB (G = 1/1 to 1/8) – SNR: 120 dB (413 Hz BW, G = 1/1) • Analog and Digital Gain Control • Output Frequency: 0.488 Hz to 250 Hz • Sine, Pulse, and DC Modes • Digital Data Input Mode

文件：1.05462 Mbytes 页数：48 Pages

TI

德州仪器

丝印：DAC1282；Package：TSSOP；DAC1282 Low Distortion Digital-to-Analog Converter for Seismic

1 Features 1• Single-Chip Test Signal Generator • Buffered Voltage Output • High Performance: – THD: –125 dB (G = 1/1 to 1/8) – SNR: 120 dB (413 Hz BW, G = 1/1) • Analog and Digital Gain Control • Output Frequency: 0.488 Hz to 250 Hz • Sine, Pulse, and DC Modes • Digital Data Input Mode

文件：1.05462 Mbytes 页数：48 Pages

TI

德州仪器

丝印：DAC1282；Package：TSSOP；DAC1282 Low Distortion Digital-to-Analog Converter for Seismic

1 Features 1• Single-Chip Test Signal Generator • Buffered Voltage Output • High Performance: – THD: –125 dB (G = 1/1 to 1/8) – SNR: 120 dB (413 Hz BW, G = 1/1) • Analog and Digital Gain Control • Output Frequency: 0.488 Hz to 250 Hz • Sine, Pulse, and DC Modes • Digital Data Input Mode

文件：1.05462 Mbytes 页数：48 Pages

TI

德州仪器

丝印：DAC1282；Package：TSSOP；DAC1282 Low Distortion Digital-to-Analog Converter for Seismic

1 Features 1• Single-Chip Test Signal Generator • Buffered Voltage Output • High Performance: – THD: –125 dB (G = 1/1 to 1/8) – SNR: 120 dB (413 Hz BW, G = 1/1) • Analog and Digital Gain Control • Output Frequency: 0.488 Hz to 250 Hz • Sine, Pulse, and DC Modes • Digital Data Input Mode

文件：1.05462 Mbytes 页数：48 Pages

TI

德州仪器

丝印：DAC1282；Package：TSSOP；DAC1282 Low Distortion Digital-to-Analog Converter for Seismic

1 Features 1• Single-Chip Test Signal Generator • Buffered Voltage Output • High Performance: – THD: –125 dB (G = 1/1 to 1/8) – SNR: 120 dB (413 Hz BW, G = 1/1) • Analog and Digital Gain Control • Output Frequency: 0.488 Hz to 250 Hz • Sine, Pulse, and DC Modes • Digital Data Input Mode

文件：1.05462 Mbytes 页数：48 Pages

TI

德州仪器

10W AC/DC Available in Wide range of output VDC

文件：1.61754 Mbytes 页数：3 Pages

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