丝印：AHT32EP；Package：TSSOP；QUADRUPLE 2-INPUT POSITIVE-OR GATE

Controlled Baseline – One Assembly/Test Site, One Fabrication Site Extended Temperature Performance of –55°C to 125°C Enhanced Diminishing Manufacturing Sources (DMS) Support Enhanced Product-Change Notification Qualification Pedigree† EPIC (Enhanced-Performance Implanted CMOS) Process

文件：199.87 Kbytes 页数：9 Pages

TI

德州仪器

丝印：AHT32EP；Package：TSSOP；QUADRUPLE 2-INPUT POSITIVE-OR GATE

Controlled Baseline – One Assembly/Test Site, One Fabrication Site Extended Temperature Performance of –55°C to 125°C Enhanced Diminishing Manufacturing Sources (DMS) Support Enhanced Product-Change Notification Qualification Pedigree† EPIC (Enhanced-Performance Implanted CMOS) Process

文件：199.87 Kbytes 页数：9 Pages

TI

德州仪器

丝印：AHT32Q；Package：WQFN；SN74AHCT32-Q1 Automotive Quadruple 2-Input Positive-OR Gate

1 Features • AEC-Q100 qualified for automotive applications: – Device temperature grade 1: -40°C to +125°C – Device HBM ESD classification level 2 – Device CDM ESD classification level C4B • Available in wettable flank QFN (WBQA) package • Operating range of 4.5 V to 5.5 V • Low power consu

文件：1.53952 Mbytes 页数：26 Pages

TI

德州仪器

丝印：AHT594Q；Package：TSSOP；SN74AHCT594-Q1 Automotive 8-Bit Shift Register With Output Registers

1 Features • AEC-Q100 qualified for automotive applications: – Device temperature grade 1: -40°C to +125°C – Device HBM ESD classification level 2 – Device CDM ESD classification level C4B • Available in wettable flank QFN (WBQA) package • Operating range 4.5V to 5.5V VCC • TTL-Compatible i

文件：1.88581 Mbytes 页数：28 Pages

TI

德州仪器

丝印：AHT595；Package：WQFN；SNx4AHCT595 8-Bit Shift Registers With 3-State Output Registers

1 Features • Inputs are TTL-voltage compatible • 8-bit serial-in, parallel-out shift • Shift register has direct clear • Latch-up performance exceeds 100mA per JESD 78, Class II • ESD protection exceeds JESD 22: – 2000V Human-Body Model (A114-A) – 200V Machine Model (A115-A) – 1000V Charg

文件：2.09046 Mbytes 页数：33 Pages

TI

德州仪器

丝印：AHT595Q；Package：TSSOP；SN74AHCT595-Q1 Automotive 8-Bit Shift Registers With 3-State Output Registers

1 Features • AEC-Q100 qualified for automotive applications: – Device temperature grade 1: -40°C to +125°C – Device HBM ESD classification level 2 – Device CDM ESD classification level C4B • Available in wettable flank QFN package • Operating range 4.5V to 5.5V VCC • TTL-Compatible inputs

文件：1.81278 Mbytes 页数：28 Pages

TI

德州仪器

丝印：AHT14EP；Package：TSSOP；HEX SCHMITT-TRIGGER INVERTER

Controlled Baseline – One Assembly/Test Site, One Fabrication Site Extended Temperature Performance of –55°C to 125°C Enhanced Diminishing Manufacturing Sources (DMS) Support Enhanced Product-Change Notification Qualification Pedigree† EPIC (Enhanced-Performance Implanted CMOS) Process

文件：703.87 Kbytes 页数：9 Pages

TI

德州仪器

丝印：AHT14EP；Package：TSSOP；HEX SCHMITT-TRIGGER INVERTER

Controlled Baseline – One Assembly/Test Site, One Fabrication Site Extended Temperature Performance of –55°C to 125°C Enhanced Diminishing Manufacturing Sources (DMS) Support Enhanced Product-Change Notification Qualification Pedigree† EPIC (Enhanced-Performance Implanted CMOS) Process

文件：703.87 Kbytes 页数：9 Pages

TI

德州仪器

丝印：AHT244EP；Package：TSSOP；OCTAL BUFFER/DRIVER WITH 3-STATE OUTPUTS

Controlled Baseline – One Assembly/Test Site, One Fabrication Site Extended Temperature Performance of –55°C to 125°C Enhanced Diminishing Manufacturing Sources (DMS) Support Enhanced Product-Change Notification Qualification Pedigree† EPIC (Enhanced-Performance Implanted CMOS) Process

文件：212.24 Kbytes 页数：10 Pages

TI

德州仪器

丝印：AHT32EP；Package：TSSOP；QUADRUPLE 2-INPUT POSITIVE-OR GATE

Controlled Baseline – One Assembly/Test Site, One Fabrication Site Extended Temperature Performance of –55°C to 125°C Enhanced Diminishing Manufacturing Sources (DMS) Support Enhanced Product-Change Notification Qualification Pedigree† EPIC (Enhanced-Performance Implanted CMOS) Process

文件：199.87 Kbytes 页数：9 Pages

TI

德州仪器