BCD to 7-segment latch/decoder/driver

GENERAL DESCRIPTION The 74HC/HCT4511 are high-speed Si-gate CMOS devices and are pin compatible with “4511” of the “4000B” series. They are specified in compliance with JEDEC standard no. 7A. FEATURES • Latch storage of BCD inputs • Blanking input • Lamp test input • Driving common cathode L

文件：80.13 Kbytes 页数：12 Pages

PHI

飞利浦

BCD to 7-segment latch/decoder/driver

1. General description The 74HC4511; 74HCT4511 is a BCD to 7-segment latch/decoder/driver with four address inputs (A, B, C, D), a latch enable input (LE), a ripple blanking input (BI), a lamp test input (LT), and seven segment outputs (a to g). When LE is LOW, the state of the segment outputs

文件：798.03 Kbytes 页数：18 Pages

NEXPERIA

安世

BCD to 7-segment latch/decoder/driver

1. General description The 74HC4511; 74HCT4511 is a BCD to 7-segment latch/decoder/driver with four address inputs (A, B, C, D), a latch enable input (LE), a ripple blanking input (BI), a lamp test input (LT), and seven segment outputs (a to g). When LE is LOW, the state of the segment outputs

文件：798.03 Kbytes 页数：18 Pages

NEXPERIA

安世

BCD to 7-segment latch/decoder/driver

GENERAL DESCRIPTION The 74HC/HCT4511 are high-speed Si-gate CMOS devices and are pin compatible with “4511” of the “4000B” series. They are specified in compliance with JEDEC standard no. 7A. FEATURES • Latch storage of BCD inputs • Blanking input • Lamp test input • Driving common cathode L

文件：80.13 Kbytes 页数：12 Pages

PHI

飞利浦

BCD to 7-segment latch/decoder/driver

GENERAL DESCRIPTION The 74HC/HCT4511 are high-speed Si-gate CMOS devices and are pin compatible with “4511” of the “4000B” series. They are specified in compliance with JEDEC standard no. 7A. FEATURES • Latch storage of BCD inputs • Blanking input • Lamp test input • Driving common cathode L

文件：80.13 Kbytes 页数：12 Pages

PHI

飞利浦

BCD to 7-segment latch/decoder/driver

The 74HC4511; 74HCT4511 is a BCD to 7-segment latch/decoder/driver with four address inputs (A, B, C, D), a latch enable input (LE), a ripple blanking input (BI), a lamp test input (LT), and seven segment outputs (a to g). When LE is LOW, the state of the segment outputs (a to g) is determined by th • Complies with JEDEC standard no. 7A\n• Input levels:• For 74HC4511: CMOS level\n• For 74HCT4511: TTL level\n\n• Latch storage of BCD inputs\n• Blanking input\n• Lamp test input\n• Driving common cathode LED displays\n• Guaranteed 10 mA drive capability per output\n• ESD protection:• HBM JESD22-A11;

Nexperia

安世

Package：16-SOIC（0.154"，3.90mm 宽）；包装：卷带（TR）剪切带（CT）Digi-Reel® 得捷定制卷带 类别：集成电路（IC） 显示驱动器 描述：IC DRVR BCD-7 SEGMENT 16SO

Nexperia USA Inc.

Package：16-SOIC（0.154"，3.90mm 宽）；包装：卷带（TR）剪切带（CT）Digi-Reel® 得捷定制卷带 类别：集成电路（IC） 显示驱动器 描述：IC DRVR BCD-7 SEGMENT 16SO

Nexperia USA Inc.