丝印：5962-9172601M3A；Package：LCCC；SCAN TEST DEVICES WITH OCTAL BUFFERS

Members of the Texas Instruments SCOPE™ Family of Testability Products Octal Test-Integrated Circuits Functionally Equivalent to ’F244 and ’BCT244 in the Normal-Function Mode Compatible With the IEEE Standard 1149.1-1990 (JTAG) Test Access Port and Boundary-Scan Architecture Test Operation

文件：462.37 Kbytes 页数：27 Pages

TI

德州仪器

丝印：5962-9172601M3A；Package：LCCC；SCAN TEST DEVICES WITH OCTAL BUFFERS

Members of the Texas Instruments SCOPE™ Family of Testability Products Octal Test-Integrated Circuits Functionally Equivalent to ’F244 and ’BCT244 in the Normal-Function Mode Compatible With the IEEE Standard 1149.1-1990 (JTAG) Test Access Port and Boundary-Scan Architecture Test Operation

文件：462.37 Kbytes 页数：27 Pages

TI

德州仪器

丝印：5962-9172601M3A；Package：LCCC；SCAN TEST DEVICES WITH OCTAL BUFFERS

Members of the Texas Instruments SCOPE™ Family of Testability Products Octal Test-Integrated Circuits Functionally Equivalent to ’F244 and ’BCT244 in the Normal-Function Mode Compatible With the IEEE Standard 1149.1-1990 (JTAG) Test Access Port and Boundary-Scan Architecture Test Operation

文件：462.37 Kbytes 页数：27 Pages

TI

德州仪器

丝印：5962-9172601M3A；Package：LCCC；SCAN TEST DEVICES WITH OCTAL BUFFERS

Members of the Texas Instruments SCOPE™ Family of Testability Products Octal Test-Integrated Circuits Functionally Equivalent to ’F244 and ’BCT244 in the Normal-Function Mode Compatible With the IEEE Standard 1149.1-1990 (JTAG) Test Access Port and Boundary-Scan Architecture Test Operation

文件：462.37 Kbytes 页数：27 Pages

TI

德州仪器

SCAN TEST DEVICES WITH OCTAL BUFFERS

文件：472.15 Kbytes 页数：26 Pages

TI

德州仪器

SCAN TEST DEVICES WITH OCTAL BUFFERS

文件：642.79 Kbytes 页数：28 Pages

TI

德州仪器