丝印：5962-9172801QLA；Package：CDIP；SCAN TEST DEVICES WITH OCTAL BUS TRANSCEIVERS

Members of the Texas Instruments SCOPE ™ Family of Testability Products Octal Test-Integrated Circuits Functionally Equivalent to ’F245 and BCT245 in the Normal- Function Mode Compatible With the IEEE Standard 1149.1-1990 (JTAG) Test Access Port and Boundary-Scan Architecture Test Operatio

文件：503.26 Kbytes 页数：29 Pages

TI

德州仪器

丝印：5962-9172801QLA；Package：CDIP；SCAN TEST DEVICES WITH OCTAL BUS TRANSCEIVERS

Members of the Texas Instruments SCOPE ™ Family of Testability Products Octal Test-Integrated Circuits Functionally Equivalent to ’F245 and BCT245 in the Normal- Function Mode Compatible With the IEEE Standard 1149.1-1990 (JTAG) Test Access Port and Boundary-Scan Architecture Test Operatio

文件：503.26 Kbytes 页数：29 Pages

TI

德州仪器

丝印：5962-9172801QLA；Package：CDIP；SCAN TEST DEVICES WITH OCTAL BUS TRANSCEIVERS

Members of the Texas Instruments SCOPE ™ Family of Testability Products Octal Test-Integrated Circuits Functionally Equivalent to ’F245 and BCT245 in the Normal- Function Mode Compatible With the IEEE Standard 1149.1-1990 (JTAG) Test Access Port and Boundary-Scan Architecture Test Operatio

文件：503.26 Kbytes 页数：29 Pages

TI

德州仪器

丝印：5962-9172801QLA；Package：CDIP；SCAN TEST DEVICES WITH OCTAL BUS TRANSCEIVERS

Members of the Texas Instruments SCOPE ™ Family of Testability Products Octal Test-Integrated Circuits Functionally Equivalent to ’F245 and BCT245 in the Normal- Function Mode Compatible With the IEEE Standard 1149.1-1990 (JTAG) Test Access Port and Boundary-Scan Architecture Test Operatio

文件：503.26 Kbytes 页数：29 Pages

TI

德州仪器

丝印：SNJ54BCT8245AJT；Package：CDIP；WITH OCTAL BUS TRANSCEIVERS

文件：1.01182 Mbytes 页数：29 Pages

TI

德州仪器

SCAN TEST DEVICES WITH OCTAL BUS TRANSCEIVERS

文件：309.38 Kbytes 页数：22 Pages

TI

德州仪器

SCAN TEST DEVICES WITH OCTAL BUS TRANSCEIVERS

文件：658.92 Kbytes 页数：29 Pages

TI

德州仪器