SN74HC10-Q1 Automotive Triple 3-Input NAND Gates

1 Features 1• AEC-Q100 Qualified for automotive applications: – Device temperature grade 1: –40°C to +125°C, TA • Buffered inputs • Positive and negative input clamp diodes • Wide operating voltage range: 2 V to 6 V • Supports fanout up to 10 LSTTL loads • Significant power reduction compa

文件：442.98 Kbytes 页数：20 Pages

TI

德州仪器

SN74HC10-Q1 Automotive Triple 3-Input NAND Gates

1 Features 1• AEC-Q100 Qualified for automotive applications: – Device temperature grade 1: –40°C to +125°C, TA • Buffered inputs • Positive and negative input clamp diodes • Wide operating voltage range: 2 V to 6 V • Supports fanout up to 10 LSTTL loads • Significant power reduction compa

文件：442.98 Kbytes 页数：20 Pages

TI

德州仪器

TRIPLE 3-INPUT POSITIVE-NAND GATE

Controlled Baseline − One Assembly/Test Site, One Fabrication Site Extended Temperature Performance of −40°C to 125°C Enhanced Diminishing Manufacturing Sources (DMS) Support Enhanced Product-Change Notification Qualification Pedigree† Wide Operating Voltage Range of 2 V to 6 V Outputs C

文件：511.35 Kbytes 页数：15 Pages

TI

德州仪器

丝印：SHC10EP；Package：SOIC；TRIPLE 3-INPUT POSITIVE-NAND GATE

Controlled Baseline − One Assembly/Test Site, One Fabrication Site Extended Temperature Performance of −40°C to 125°C Enhanced Diminishing Manufacturing Sources (DMS) Support Enhanced Product-Change Notification Qualification Pedigree† Wide Operating Voltage Range of 2 V to 6 V Outputs C

文件：511.35 Kbytes 页数：15 Pages

TI

德州仪器

丝印：SHC10EP；Package：SOIC；TRIPLE 3-INPUT POSITIVE-NAND GATE

Controlled Baseline − One Assembly/Test Site, One Fabrication Site Extended Temperature Performance of −40°C to 125°C Enhanced Diminishing Manufacturing Sources (DMS) Support Enhanced Product-Change Notification Qualification Pedigree† Wide Operating Voltage Range of 2 V to 6 V Outputs C

文件：511.35 Kbytes 页数：15 Pages

TI

德州仪器

丝印：SHC10EP；Package：TSSOP；TRIPLE 3-INPUT POSITIVE-NAND GATE

Controlled Baseline − One Assembly/Test Site, One Fabrication Site Extended Temperature Performance of −40°C to 125°C Enhanced Diminishing Manufacturing Sources (DMS) Support Enhanced Product-Change Notification Qualification Pedigree† Wide Operating Voltage Range of 2 V to 6 V Outputs C

文件：511.35 Kbytes 页数：15 Pages

TI

德州仪器

丝印：SHC10EP；Package：TSSOP；TRIPLE 3-INPUT POSITIVE-NAND GATE

Controlled Baseline − One Assembly/Test Site, One Fabrication Site Extended Temperature Performance of −40°C to 125°C Enhanced Diminishing Manufacturing Sources (DMS) Support Enhanced Product-Change Notification Qualification Pedigree† Wide Operating Voltage Range of 2 V to 6 V Outputs C

文件：511.35 Kbytes 页数：15 Pages

TI

德州仪器

丝印：HC10QQ1；Package：TSSOP；SN74HC10-Q1 Automotive Triple 3-Input NAND Gates

1 Features 1• AEC-Q100 Qualified for automotive applications: – Device temperature grade 1: –40°C to +125°C, TA • Buffered inputs • Positive and negative input clamp diodes • Wide operating voltage range: 2 V to 6 V • Supports fanout up to 10 LSTTL loads • Significant power reduction compa

文件：442.98 Kbytes 页数：20 Pages

TI

德州仪器

丝印：HC10QQ1；Package：TSSOP；SN74HC10-Q1 Automotive Triple 3-Input NAND Gates

1 Features 1• AEC-Q100 Qualified for automotive applications: – Device temperature grade 1: –40°C to +125°C, TA • Buffered inputs • Positive and negative input clamp diodes • Wide operating voltage range: 2 V to 6 V • Supports fanout up to 10 LSTTL loads • Significant power reduction compa

文件：442.98 Kbytes 页数：20 Pages

TI

德州仪器

SN74HC125-Q1 Automotive Quadruple Buffers with 3-State Outputs

1 Features 1• AEC-Q100 Qualified for automotive applications: – Device temperature grade 1: –40°C to +125°C, TA • Buffered inputs • Positive and negative input clamp diodes • Wide operating voltage range: 2 V to 6 V • Supports fanout up to 10 LSTTL loads • Significant power reduction compa

文件：448.02 Kbytes 页数：21 Pages

TI

德州仪器