TRIPLE 3-INPUT POSITIVE-NAND GATE

Controlled Baseline − One Assembly/Test Site, One Fabrication Site Extended Temperature Performance of −40°C to 125°C Enhanced Diminishing Manufacturing Sources (DMS) Support Enhanced Product-Change Notification Qualification Pedigree† Wide Operating Voltage Range of 2 V to 6 V Outputs C

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德州仪器

SN74HC10-Q1 Automotive Triple 3-Input NAND Gates

1 Features 1• AEC-Q100 Qualified for automotive applications: – Device temperature grade 1: –40°C to +125°C, TA • Buffered inputs • Positive and negative input clamp diodes • Wide operating voltage range: 2 V to 6 V • Supports fanout up to 10 LSTTL loads • Significant power reduction compa

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德州仪器

TRIPLE 3-INPUT POSITIVE-NAND GATE

文件：540.24 Kbytes 页数：11 Pages

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德州仪器

增强型产品 3 通道、3 输入、2V 至 6V 与非门

The SN74HC10 device contains three independent 3-input NAND gates. It performs the Boolean function Y = (A • B • C)\\ or Y = A\\ + B\\ + C\\ in positive logic. • Controlled Baseline \n• Extended Temperature Performance of –40°C to 125°C\n• Enhanced Product-Change Notification\n• Wide Operating Voltage Range of 2 V to 6 V\n• Low Power Consumption, 20-µA Max ICC\n• ±4-mA Output Drive at 5 V\n• Low Input Current of 1 µA Max\n Component qualification in acco;

TI

德州仪器