SN74HC10-EP中文资料增强型产品 3 通道、3 输入、2V 至 6V 与非门数据手册TI规格书

描述 Description

The SN74HC10 device contains three independent 3-input NAND gates. It performs the Boolean function Y = (A • B • C)\\ or Y = A\\ + B\\ + C\\ in positive logic.

特性 Features

• Controlled Baseline
• Extended Temperature Performance of –40°C to 125°C
• Enhanced Product-Change Notification
• Wide Operating Voltage Range of 2 V to 6 V
• Low Power Consumption, 20-µA Max ICC
• ±4-mA Output Drive at 5 V
• Low Input Current of 1 µA Max
Component qualification in accordance with JEDEC and industry standards to ensure reliable operation over an extended temperature range. This includes, but is not limited to, Highly Accelerated Stress Test (HAST) or biased 85/85, temperature cycle, autoclave or unbiased HAST, electromigration, bond intermetallic life, and mold compound life. Such qualification testing should not be viewed as justifying use of this component beyond specified performance and environmental limits.