SN74HC10-EP数据手册TI中文资料规格书

描述 Description

The SN74HC10 device contains three independent 3-input NAND gates. It performs the Boolean function Y = (A • B • C)\\ or Y = A\\ + B\\ + C\\ in positive logic.

特性 Features

• Controlled Baseline
• One Assembly/Test Site, One Fabrication Site

• Extended Temperature Performance of –40°C to 125°C
• Enhanced Diminishing Manufacturing Sources (DMS) Support
• Enhanced Product-Change Notification
• Qualification Pedigree
• Wide Operating Voltage Range of 2 V to 6 V
• Outputs Can Drive Up To 10 LSTTL Loads
• Low Power Consumption, 20-µA Max ICC
• Typical tpd = 9 ns
• ±4-mA Output Drive at 5 V
• Low Input Current of 1 µA Max
Component qualification in accordance with JEDEC and industry standards to ensure reliable operation over an extended temperature range. This includes, but is not limited to, Highly Accelerated Stress Test (HAST) or biased 85/85, temperature cycle, autoclave or unbiased HAST, electromigration, bond intermetallic life, and mold compound life. Such qualification testing should not be viewed as justifying use of this component beyond specified performance and environmental limits.