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SN74ABTH18646APM

丝印:ABTH18646A;Package:LQFP;SCAN TEST DEVICES WITH 18-BIT TRANSCEIVERS AND REGISTERS

Members of the Texas Instruments SCOPE E Family of Testability Products Members of the Texas Instruments WidebusE Family Compatible With the IEEE Standard 1149.1-1990 (JTAG) Test Access Port and Boundary-Scan Architecture Include D-Type Flip-Flops and Control Circuitry to Provide Multiplex

文件:851.46 Kbytes 页数:42 Pages

TI

德州仪器

SN74ABTH18646APM

丝印:ABTH18646A;Package:LQFP;SCAN TEST DEVICES WITH 18-BIT TRANSCEIVERS AND REGISTERS

Members of the Texas Instruments SCOPE E Family of Testability Products Members of the Texas Instruments WidebusE Family Compatible With the IEEE Standard 1149.1-1990 (JTAG) Test Access Port and Boundary-Scan Architecture Include D-Type Flip-Flops and Control Circuitry to Provide Multiplex

文件:824.64 Kbytes 页数:43 Pages

TI

德州仪器

SN74ABTH18646APM

SCAN TEST DEVICES WITH 18-BIT TRANSCEIVERS AND REGISTERS

文件:559.74 Kbytes 页数:37 Pages

TI

德州仪器

SN74ABTH18646APM

SCAN TEST DEVICES WITH 18-BIT TRANSCEIVERS AND REGISTERS

文件:656.91 Kbytes 页数:41 Pages

TI

德州仪器

SN74ABTH18646APM.B

丝印:ABTH18646A;Package:LQFP;SCAN TEST DEVICES WITH 18-BIT TRANSCEIVERS AND REGISTERS

Members of the Texas Instruments SCOPE E Family of Testability Products Members of the Texas Instruments WidebusE Family Compatible With the IEEE Standard 1149.1-1990 (JTAG) Test Access Port and Boundary-Scan Architecture Include D-Type Flip-Flops and Control Circuitry to Provide Multiplex

文件:824.64 Kbytes 页数:43 Pages

TI

德州仪器

SN74ABTH18646APMG4.B

丝印:ABTH18646A;Package:LQFP;SCAN TEST DEVICES WITH 18-BIT TRANSCEIVERS AND REGISTERS

Members of the Texas Instruments SCOPE E Family of Testability Products Members of the Texas Instruments WidebusE Family Compatible With the IEEE Standard 1149.1-1990 (JTAG) Test Access Port and Boundary-Scan Architecture Include D-Type Flip-Flops and Control Circuitry to Provide Multiplex

文件:824.64 Kbytes 页数:43 Pages

TI

德州仪器

SN74ABTH18646APM

Package:64-LQFP;包装:卷带(TR)剪切带(CT)Digi-Reel® 得捷定制卷带 类别:集成电路(IC) 专用逻辑器件 描述:IC SCAN-TEST-DEV/TXRX 64-LQFP

TI2

德州仪器

产品属性

  • 产品编号:

    SN74ABTH18646APM

  • 制造商:

    Texas Instruments

  • 类别:

    集成电路(IC) > 专用逻辑器件

  • 系列:

    74ABTH

  • 包装:

    卷带(TR)剪切带(CT)Digi-Reel® 得捷定制卷带

  • 逻辑类型:

    扫描测试设备,带收发器和寄存器

  • 供电电压:

    4.5V ~ 5.5V

  • 位数:

    18

  • 工作温度:

    -40°C ~ 85°C

  • 安装类型:

    表面贴装型

  • 封装/外壳:

    64-LQFP

  • 供应商器件封装:

    64-LQFP(10x10)

  • 描述:

    IC SCAN-TEST-DEV/TXRX 64-LQFP

供应商型号品牌批号封装库存备注价格
24+
WQFN24
6000
美国德州仪器TEXASINSTRUMENTS原厂代理辉华拓展内地现
询价
TI(德州仪器)
24+
LQFP64(10x10)
1019
只做原装,提供一站式配单服务,代工代料。BOM配单
询价
TI
25+
LQFP64
12
百分百原装正品 真实公司现货库存 本公司只做原装 可
询价
TI
25+
LQFP64
2685
原装优势!自家现货供应!欢迎来电!
询价
Texas Instruments
24+
64-LQFP(10x10)
56200
一级代理/放心采购
询价
TI
25+
QFP-64
932
就找我吧!--邀您体验愉快问购元件!
询价
TI/德州仪器
24+
LQFP-64
9600
原装现货,优势供应,支持实单!
询价
TI
22+
64LQFP
9000
原厂渠道,现货配单
询价
TI/德州仪器
25+
LQFP-64
8880
原装认准芯泽盛世!
询价
TI
7
公司优势库存 热卖中!
询价
更多SN74ABTH18646APM供应商 更新时间2025-10-4 14:04:00