丝印：ABTH18646A；Package：LQFP(PM)；SCAN TEST DEVICES WITH 18-BIT TRANSCEIVERS AND REGISTERS

Members of the Texas Instruments SCOPE E Family of Testability Products Members of the Texas Instruments WidebusE Family Compatible With the IEEE Standard 1149.1-1990 (JTAG) Test Access Port and Boundary-Scan Architecture Include D-Type Flip-Flops and Control Circuitry to Provide Multiplex

文件：825.24 Kbytes 页数：43 Pages

TI

德州仪器

丝印：ABTH18646A；Package：LQFP(PM)；SCAN TEST DEVICES WITH 18-BIT TRANSCEIVERS AND REGISTERS

Members of the Texas Instruments SCOPE E Family of Testability Products Members of the Texas Instruments WidebusE Family Compatible With the IEEE Standard 1149.1-1990 (JTAG) Test Access Port and Boundary-Scan Architecture Include D-Type Flip-Flops and Control Circuitry to Provide Multiplex

文件：825.24 Kbytes 页数：43 Pages

TI

德州仪器

丝印：ABTH18646A；Package：LQFP；SCAN TEST DEVICES WITH 18-BIT TRANSCEIVERS AND REGISTERS

Members of the Texas Instruments SCOPE E Family of Testability Products Members of the Texas Instruments WidebusE Family Compatible With the IEEE Standard 1149.1-1990 (JTAG) Test Access Port and Boundary-Scan Architecture Include D-Type Flip-Flops and Control Circuitry to Provide Multiplex

文件：824.64 Kbytes 页数：43 Pages

TI

德州仪器

TSSOP20

TI/德州仪器

上传：深圳市河锋鑫科技有限公司

TSSOP14

TI

德州仪器

上传：深圳市河锋鑫科技有限公司